Wei-Kong Chia

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1991

2 Tsu-Wei Ku, Wei-Kong Chia: A Sequential Test Generator with Explicit Elimination of Easy-to-Test Faults. ITC 1991: 83-87

1990

1 Tsu-Wei Ku, Wei-Kong Chia: Test Vector Minimization During Logic Synthesis. ICCAD 1990: 318-321

	1991
2		Tsu-Wei Ku, Wei-Kong Chia: A Sequential Test Generator with Explicit Elimination of Easy-to-Test Faults. ITC 1991: 83-87
	1990
1		Tsu-Wei Ku, Wei-Kong Chia: Test Vector Minimization During Logic Synthesis. ICCAD 1990: 318-321

Coauthor Index

1 Tsu-Wei Ku [1] [2]

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