Kin P. Cheung

	2011
3		Jason T. Ryan, Lan Wei, Jason P. Campbell, Ricki G. Southwick, Kin P. Cheung, Anthony S. Oates, H.-S. Philip Wong, John Suehle: Circuit-aware device reliability criteria methodology. ESSCIRC 2011: 255-258
	2001
2		Kin P. Cheung: Unifying the thermal-chemical and anode-hole-injection gate-oxide breakdown models. Microelectronics Reliability 41(2): 193-199 (2001)
1		Kin P. Cheung: Impact of ESD protection device trigger transient on the reliability of ultra-thin gate oxide. Microelectronics Reliability 41(5): 745-749 (2001)

Coauthor Index

1	Jason P. Campbell	[3]
2	Anthony S. Oates	[3]
3	Jason T. Ryan	[3]
4	Ricki G. Southwick	[3]
5	John Suehle	[3]
6	Lan Wei	[3]
7	H.-S. Philip Wong	[3]

Last update Sun May 27 04:04:01 2012 CET by the DBLP Team — Data released under the ODC-BY 1.0 license — See also our legal information page