Wu-Tung Cheng

	2011
81		Xiaoxin Fan, Huaxing Tang, Sudhakar M. Reddy, Wu-Tung Cheng, Brady Benware: On Using Design Partitioning to Reduce Diagnosis Memory Footprint. Asian Test Symposium 2011: 219-225
80		Xun Tang, Wu-Tung Cheng, Ruifeng Guo, Huaxing Tang, Sudhakar M. Reddy: Diagnosis of Multiple Faults Based on Fault-Tuple Equivalence Tree. DFT 2011: 217-225
79		Andras Kun, Ralf Arnold, Peter Heinrich, Gwenolé Maugard, Huaxing Tang, Wu-Tung Cheng: Deterministic IDDQ diagnosis using a net activation based model. ITC 2011: 1-10
78		Manish Sharma, Avijit Dutta, Wu-Tung Cheng, Brady Benware, Mark Kassab: A novel Test Access Mechanism for failure diagnosis of multiple isolated identical cores. ITC 2011: 1-9
	2010
77		Meng-Fan Wu, Hsin-Cheih Pan, T.-H. Wang, Jiun-Lang Huang, Kun-Han Tsai, Wu-Tung Cheng: Improved weight assignment for logic switching activity during at-speed test pattern generation. ASP-DAC 2010: 493-498
76		Ke Peng, Yu Huang, Ruifeng Guo, Wu-Tung Cheng, Mohammad Tehranipoor: Emulating and diagnosing IR-drop by using dynamic SDF. ASP-DAC 2010: 511-516
75		Wu-Tung Cheng, Yu Huang: Enhance Profiling-Based Scan Chain Diagnosis by Pattern Masking. Asian Test Symposium 2010: 255-260
74		Xun Tang, Wu-Tung Cheng, Ruifeng Guo, Sudhakar M. Reddy: Diagnosis of Multiple Physical Defects Using Logic Fault Models. Asian Test Symposium 2010: 94-99
73		Ke Peng, Yu Huang, Pinki Mallick, Wu-Tung Cheng, Mohammad Tehranipoor: Full-circuit SPICE simulation based validation of dynamic delay estimation. European Test Symposium 2010: 101-106
72		Jing Zeng, Ruifeng Guo, Wu-Tung Cheng, Michael Mateja, Jing Wang, Kun-Han Tsai, Ken Amstutz: Scan based speed-path debug for a microprocessor. European Test Symposium 2010: 207-212
71		Meng-Fan Wu, Kun-Han Tsai, Wu-Tung Cheng, Hsin-Cheih Pan, Jiun-Lang Huang, Augusli Kifli: A scalable quantitative measure of IR-drop effects for scan pattern generation. ICCAD 2010: 162-167
70		Kun-Han Tsai, Yu Huang, Wu-Tung Cheng, Ting-Pu Tai, Augusli Kifli: Test cycle power optimization for scan-based designs. ITC 2010: 134-143
69		Yu Huang, Brady Benware, Wu-Tung Cheng, Ting-Pu Tai, Feng-Ming Kuo, Yuan-Shih Chen: Case study of scan chain diagnosis and PFA on a low yield wafer. ITC 2010: 818
68		Elif Alpaslan, Yu Huang, Xijiang Lin, Wu-Tung Cheng, Jennifer Dworak: On Reducing Scan Shift Activity at RTL. IEEE Trans. on CAD of Integrated Circuits and Systems 29(7): 1110-1120 (2010)
	2009
67		Yu Huang, Wu-Tung Cheng, Ruifeng Guo, Ting-Pu Tai, Feng-Ming Kuo, Yuan-Shih Chen: Scan Chain Diagnosis by Adaptive Signal Profiling with Manufacturing ATPG Patterns. Asian Test Symposium 2009: 35-40
66		Xun Tang, Ruifeng Guo, Wu-Tung Cheng, Sudhakar M. Reddy, Yu Huang: On Improving Diagnostic Test Generation for Scan Chain Failures. Asian Test Symposium 2009: 41-46
65		Kun-Han Tsai, Ruifeng Guo, Wu-Tung Cheng: At-Speed Scan Test Method for the Timing Optimization and Calibration. Asian Test Symposium 2009: 430-433
64		Xun Tang, Ruifeng Guo, Wu-Tung Cheng, Sudhakar M. Reddy: Improving compressed test pattern generation for multiple scan chain failure diagnosis. DATE 2009: 1000-1005
63		Ruifeng Guo, Wu-Tung Cheng, Kun-Han Tsai: Speed-Path Debug Using At-Speed Scan Test Patterns. European Test Symposium 2009: 11-16
	2008
62		Yu Huang, Wu-Tung Cheng, Ruifeng Guo: Diagnose Multiple Stuck-at Scan Chain Faults. European Test Symposium 2008: 105-110
61		Ruifeng Guo, Liyang Lai, Yu Huang, Wu-Tung Cheng: Detection and Diagnosis of Static Scan Cell Internal Defect. ITC 2008: 1-10
60		Stefan Hillebrecht, Ilia Polian, Piet Engelke, Bernd Becker, Martin Keim, Wu-Tung Cheng: Extraction, Simulation and Test Generation for Interconnect Open Defects Based on Enhanced Aggressor-Victim Model. ITC 2008: 1-10
59		Manish Sharma, Brady Benware, Lei Ling, David Abercrombie, Lincoln Lee, Martin Keim, Huaxing Tang, Wu-Tung Cheng, Ting-Pu Tai, Yi-Jung Chang, Reinhart Lin, Albert Mann: Efficiently Performing Yield Enhancements by Identifying Dominant Physical Root Cause from Test Fail Data. ITC 2008: 1-9
58		Elif Alpaslan, Yu Huang, Xijiang Lin, Wu-Tung Cheng, Jennifer Dworak: Reducing Scan Shift Power at RTL. VTS 2008: 139-146
57		Stefan Spinner, Ilia Polian, Piet Engelke, Bernd Becker, Martin Keim, Wu-Tung Cheng: Automatic Test Pattern Generation for Interconnect Open Defects. VTS 2008: 181-186
56		Yu Huang, Ruifeng Guo, Wu-Tung Cheng, James Chien-Mo Li: Survey of Scan Chain Diagnosis. IEEE Design & Test of Computers 25(3): 240-248 (2008)
55		Janusz Rajski, Jerzy Tyszer, Grzegorz Mrugalski, Wu-Tung Cheng, Nilanjan Mukherjee, Mark Kassab: X-Press: Two-Stage X-Tolerant Compactor With Programmable Selector. IEEE Trans. on CAD of Integrated Circuits and Systems 27(1): 147-159 (2008)
	2007
54		Ruifeng Guo, Yu Huang, Wu-Tung Cheng: A complete test set to diagnose scan chain failures. ITC 2007: 1-10
53		Yu Huang, Wu-Tung Cheng, Ruifeng Guo, Will Hsu, Yuan-Shih Chen, Albert Mann: Diagnose compound scan chain and system logic defects. ITC 2007: 1-10
52		Manish Sharma, Wu-Tung Cheng, Ting-Pu Tai, Y. S. Cheng, Will Hsu, Chen Liu, Sudhakar M. Reddy, Albert Mann: Faster defect localization in nanometer technology based on defective cell diagnosis. ITC 2007: 1-10
51		Chen Liu, Wei Zou, Sudhakar M. Reddy, Wu-Tung Cheng, Manish Sharma, Huaxing Tang: Interconnect open defect diagnosis with minimal physical information. ITC 2007: 1-10
50		Wei Zou, Wu-Tung Cheng, Sudhakar M. Reddy, Huaxing Tang: Speeding Up Effect-Cause Defect Diagnosis Using a Small Dictionary. VTS 2007: 225-230
49		Jerzy Tyszer, Janusz Rajski, Grzegorz Mrugalski, Nilanjan Mukherjee, Mark Kassab, Wu-Tung Cheng, Manish Sharma, Liyang Lai: X-Tolerant Compactor with On-Chip Registration and Signature-Based Diagnosis. IEEE Design & Test of Computers 24(5): 476-485 (2007)
	2006
48		Yu Huang, Wu-Tung Cheng, Nagesh Tamarapalli, Janusz Rajski, Randy Klingenberg, Will Hsu, Yuan-Shih Chen: Diagnosis with Limited Failure Information. ITC 2006: 1-10
47		Janusz Rajski, Jerzy Tyszer, Grzegorz Mrugalski, Wu-Tung Cheng, Nilanjan Mukherjee, Mark Kassab: X-Press Compactor for 1000x Reduction of Test Data. ITC 2006: 1-10
46		Nandu Tendolkar, Dawit Belete, Bill Schwarz, Bob Podnar, Akshay Gupta, Steve Karako, Wu-Tung Cheng, Alex Babin, Kun-Han Tsai, Nagesh Tamarapalli, Greg Aldrich: Improving Transition Fault Test Pattern Quality through At-Speed Diagnosis. ITC 2006: 1-9
45		Wu-Tung Cheng, Manish Sharma, Thomas Rinderknecht, Liyang Lai, Chris Hill: Signature Based Diagnosis for Logic BIST. ITC 2006: 1-9
44		Wei Zou, Wu-Tung Cheng, Sudhakar M. Reddy, Huaxing Tang: On Methods to Improve Location Based Logic Diagnosis. VLSI Design 2006: 181-187
	2005
43		Yu Huang, Wu-Tung Cheng, Greg Crowell: Using fault model relaxation to diagnose real scan chain defects. ASP-DAC 2005: 1176-1179
42		Wei Zou, Wu-Tung Cheng, Sudhakar M. Reddy: Bridge Defect Diagnosis with Physical Information. Asian Test Symposium 2005: 248-253
41		Jay Jahangiri, Nilanjan Mukherjee, Wu-Tung Cheng, Subramanian Mahadevan, Ron Press: Achieving High Test Quality with Reduced Pin Count Testing. Asian Test Symposium 2005: 312-317
40		Liyang Lai, Janak H. Patel, Thomas Rinderknecht, Wu-Tung Cheng: Hardware Ef.cient LBISTWith Complementary Weights. ICCD 2005: 479-484
39		Andreas Leininger, Peter Muhmenthaler, Wu-Tung Cheng, Nagesh Tamarapalli, Wu Yang, Hans Tsai: Compression mode diagnosis enables high volume monitoring diagnosis flow. ITC 2005: 10
38		Yu Huang, Wu-Tung Cheng, Janusz Rajski: Compressed pattern diagnosis for scan chain failures. ITC 2005: 8
37		Xiaogang Du, Nilanjan Mukherjee, Wu-Tung Cheng, Sudhakar M. Reddy: Full-speed field-programmable memory BIST architecture. ITC 2005: 9
36		Manish Sharma, Wu-Tung Cheng: X-filter: filtering unknowns from compacted test responses. ITC 2005: 9
	2004
35		Wu-Tung Cheng, Kun-Han Tsai, Yu Huang, Nagesh Tamarapalli, Janusz Rajski: Compactor Independent Direct Diagnosis. Asian Test Symposium 2004: 204-209
34		Yu Huang, Wu-Tung Cheng, Cheng-Ju Hsieh, Huan-Yung Tseng, Alou Huang, Yu-Ting Hung: Intermittent Scan Chain Fault Diagnosis Based on Signal Probability Analysis. DATE 2004: 1072-1077
33		Liyang Lai, Janak H. Patel, Thomas Rinderknecht, Wu-Tung Cheng: Logic BIST with Scan Chain Segmentation. ITC 2004: 57-66
32		Xiaogang Du, Sudhakar M. Reddy, Wu-Tung Cheng, Joseph Rayhawk, Nilanjan Mukherjee: At-Speed Built-in Self-Repair Analyzer for Embedded Word-Oriented Memories. VLSI Design 2004: 895-900
31		Liyang Lai, Thomas Rinderknecht, Wu-Tung Cheng, Janak H. Patel: Logic BIST Using Constrained Scan Cells. VTS 2004: 199-205
30		Xiaogang Du, Sudhakar M. Reddy, Don E. Ross, Wu-Tung Cheng, Joseph Rayhawk: Memory BIST Using ESP. VTS 2004: 243-248
	2003
29		Xiaogang Du, Sudhakar M. Reddy, Joseph Rayhawk, Wu-Tung Cheng: Testing Delay Faults in Embedded CAMs. Asian Test Symposium 2003: 378-383
28		Yu Huang, Wu-Tung Cheng, Cheng-Ju Hsieh, Huan-Yung Tseng, Alou Huang, Yu-Ting Hung: Efficient Diagnosis for Multiple Intermittent Scan Chain Hold-Time Faults. Asian Test Symposium 2003: 44-49
27		Yu Huang, Wu-Tung Cheng: Using embedded infrastructure IP for SOC post-silicon verification. DAC 2003: 674-677
26		Yu Huang, Wu-Tung Cheng, Chien-Chung Tsai, Nilanjan Mukherjee, Sudhakar M. Reddy: Static Pin Mapping and SOC Test Scheduling for Cores with Multiple Test Sets. ISQED 2003: 99-104
25		Wu-Tung Cheng: Silicon Diagnosis. ITC 2003: 1305
24		Yu Huang, Wu-Tung Cheng, Sudhakar M. Reddy, Cheng-Ju Hsieh, Yu-Ting Hung: Statistical Diagnosis for Intermittent Scan Chain Hold-Time Fault. ITC 2003: 319-328
23		Theo J. Powell, Wu-Tung Cheng, Joseph Rayhawk, Omer Samman, Paul Policke, Sherry Lai: BIST for Deep Submicron ASIC Memories with High Performance Application. ITC 2003: 386-392
	2002
22		Yu Huang, Sudhakar M. Reddy, Wu-Tung Cheng: Core - Clustering Based SOC Test Scheduling Optimization. Asian Test Symposium 2002: 405-410
21		Yu Huang, Sudhakar M. Reddy, Wu-Tung Cheng, Paul Reuter, Nilanjan Mukherjee, Chien-Chung Tsai, Omer Samman, Yahya Zaidan: Optimal Core Wrapper Width Selection and SOC Test Scheduling Based on 3-D Bin Packing Algorithm. ITC 2002: 74-82
20		Yu Huang, Nilanjan Mukherjee, Chien-Chung Tsai, Omer Samman, Yahya Zaidan, Yanping Zhang, Wu-Tung Cheng, Sudhakar M. Reddy: Constraint Driven Pin Mapping for Concurrent SOC Testing. VLSI Design 2002: 511-516
19		Yu Huang, Chien-Chung Tsai, Nilanjan Mukherjee, Omer Samman, Wu-Tung Cheng, Sudhakar M. Reddy: Synthesis of Scan Chains for Netlist Descriptions at RT-Level. J. Electronic Testing 18(2): 189-201 (2002)
18		Yu Huang, Wu-Tung Cheng, Chien-Chung Tsai, Nilanjan Mukherjee, Omer Samman, Yahya Zaidan, Sudhakar M. Reddy: On Concurrent Test of Core-Based SOC Design. J. Electronic Testing 18(4-5): 401-414 (2002)
	2001
17		Yu Huang, Wu-Tung Cheng, Chien-Chung Tsai, Nilanjan Mukherjee, Omer Samman, Yahya Zaidan, Sudhakar M. Reddy: Resource Allocation and Test Scheduling for Concurrent Test of Core-Based SoC D. Asian Test Symposium 2001: 265-
16		Yu Huang, Chien-Chung Tsai, Nilanjan Mukherjee, Omer Samman, Dan Devries, Wu-Tung Cheng, Sudhakar M. Reddy: On RTL scan design. ITC 2001: 728-737
	2000
15		Wu-Tung Cheng: Current status and future trend on CAD tools for VLSI testing Wu-Tung Cheng. Asian Test Symposium 2000: 10-
14		Xijiang Lin, Wu-Tung Cheng, Irith Pomeranz, Sudhakar M. Reddy: SIFAR: Static Test Compaction for Synchronous Sequential Circuits Based on Single Fault Restoration. VTS 2000: 205-212
	1999
13		Wu-Tung Cheng: High time for high level ATPG. ITC 1999: 1113
	1996
12		Bejoy G. Oomman, Wu-Tung Cheng, John A. Waicukauski: A Universal Technique for Accelerating Simulation of Scan Test Patterns. ITC 1996: 135-141
	1992
11		Thomas M. Niermann, Wu-Tung Cheng, Janak H. Patel: PROOFS: a fast, memory-efficient sequential circuit fault simulator. IEEE Trans. on CAD of Integrated Circuits and Systems 11(2): 198-207 (1992)
10		Wu-Tung Cheng, James L. Lewandowski, Eleanor Wu: Optimal diagnostic methods for wiring interconnects. IEEE Trans. on CAD of Integrated Circuits and Systems 11(9): 1161-1166 (1992)
	1990
9		Thomas M. Niermann, Wu-Tung Cheng, Janak H. Patel: Proofs: A Fast, Memory Efficient Sequential Circuit Fault Simulator. DAC 1990: 535-540
8		Wu-Tung Cheng, Janak H. Patel: PROOFS: a super fast fault simulator for sequential circuits. EURO-DAC 1990: 475-479
7		Wu-Tung Cheng, James L. Lewandowski, Eleanor Wu: Diagnosis for wiring interconnects. ITC 1990: 565-571
6		Wu-Tung Cheng, Meng-Lin Yu: Differential fault simulation for sequential circuits. J. Electronic Testing 1(1): 7-13 (1990)
	1989
5		Wu-Tung Cheng, Meng-Lin Yu: Differential Fault Simulation - a Fast Method Using Minimal Memory. DAC 1989: 424-428
4		Wu-Tung Cheng, Tapan J. Chakraborty: Gentest: An Automatic Test-Generation System for Sequential Circuits. IEEE Computer 22(4): 43-49 (1989)
	1988
3		Wu-Tung Cheng: Split Circuit Model for Test Generation. DAC 1988: 96-101
	1987
2		Wu-Tung Cheng, Janak H. Patel: A Minimum Test Set for Multiple Fault Detection in Ripple Carry Adders. IEEE Trans. Computers 36(7): 891-895 (1987)
	1985
1		Wu-Tung Cheng, Janak H. Patel: Multiple-Fault Detection in Iterative Logic Arrays. ITC 1985: 493-499

Coauthor Index

1	David Abercrombie	[59]
2	Greg Aldrich	[46]
3	Elif Alpaslan	[58] [68]
4	Ken Amstutz	[72]
5	Ralf Arnold	[79]
6	Alex Babin	[46]
7	Bernd Becker	[57] [60]
8	Dawit Belete	[46]
9	Brady Benware	[59] [69] [78] [81]
10	Tapan J. Chakraborty	[4]
11	Yi-Jung Chang	[59]
12	Yuan-Shih Chen	[48] [53] [67] [69]
13	Y. S. Cheng	[52]
14	Greg Crowell	[43]
15	Dan Devries	[16]
16	Xiaogang Du	[29] [30] [32] [37]
17	Avijit Dutta	[78]
18	Jennifer Dworak	[58] [68]
19	Piet Engelke	[57] [60]
20	Xiaoxin Fan	[81]
21	Ruifeng Guo	[53] [54] [56] [61] [62] [63] [64] [65] [66] [67] [72] [74] [76] [80]
22	Akshay Gupta	[46]
23	Peter Heinrich	[79]
24	Chris Hill	[45]
25	Stefan Hillebrecht	[60]
26	Cheng-Ju Hsieh	[24] [28] [34]
27	Will Hsu	[48] [52] [53]
28	Alou Huang	[28] [34]
29	Jiun-Lang Huang	[71] [77]
30	Yu Huang	[16] [17] [18] [19] [20] [21] [22] [24] [26] [27] [28] [34] [35] [38] [43] [48] [53] [54] [56] [58] [61] [62] [66] [67] [68] [69] [70] [73] [75] [76]
31	Yu-Ting Hung	[24] [28] [34]
32	Jay Jahangiri	[41]
33	Steve Karako	[46]
34	Mark Kassab	[47] [49] [55] [78]
35	Martin Keim	[57] [59] [60]
36	Augusli Kifli	[70] [71]
37	Randy Klingenberg	[48]
38	Andras Kun	[79]
39	Feng-Ming Kuo	[67] [69]
40	Liyang Lai	[31] [33] [40] [45] [49] [61]
41	Sherry Lai	[23]
42	Lincoln Lee	[59]
43	Andreas Leininger	[39]
44	James L. Lewandowski	[7] [10]
45	Chien-Mo James Li (James Chien-Mo Li, J. C.-M. Li)	[56]
46	Reinhart Lin	[59]
47	Xijiang Lin	[14] [58] [68]
48	Lei Ling	[59]
49	Chen Liu	[51] [52]
50	Subramanian Mahadevan	[41]
51	Pinki Mallick	[73]
52	Albert Mann	[52] [53] [59]
53	Michael Mateja	[72]
54	Gwenolé Maugard	[79]
55	Grzegorz Mrugalski	[47] [49] [55]
56	Peter Muhmenthaler	[39]
57	Nilanjan Mukherjee	[16] [17] [18] [19] [20] [21] [26] [32] [37] [41] [47] [49] [55]
58	Thomas M. Niermann	[9] [11]
59	Bejoy G. Oomman	[12]
60	Hsin-Cheih Pan	[71] [77]
61	Janak H. Patel	[1] [2] [8] [9] [11] [31] [33] [40]
62	Ke Peng	[73] [76]
63	Bob Podnar	[46]
64	Ilia Polian	[57] [60]
65	Paul Policke	[23]
66	Irith Pomeranz	[14]
67	Theo J. Powell	[23]
68	Ron Press	[41]
69	Janusz Rajski	[35] [38] [47] [48] [49] [55]
70	Joseph Rayhawk	[23] [29] [30] [32]
71	Sudhakar M. Reddy	[14] [16] [17] [18] [19] [20] [21] [22] [24] [26] [29] [30] [32] [37] [42] [44] [50] [51] [52] [64] [66] [74] [80] [81]
72	Paul Reuter	[21]
73	Thomas Rinderknecht	[31] [33] [40] [45]
74	Don E. Ross	[30]
75	Omer Samman	[16] [17] [18] [19] [20] [21] [23]
76	Bill Schwarz	[46]
77	Manish Sharma	[36] [45] [49] [51] [52] [59] [78]
78	Stefan Spinner	[57]
79	Ting-Pu Tai	[52] [59] [67] [69] [70]
80	Nagesh Tamarapalli	[35] [39] [46] [48]
81	Huaxing Tang	[44] [50] [51] [59] [79] [80] [81]
82	Xun Tang	[64] [66] [74] [80]
83	Mohammad Tehranipoor	[73] [76]
84	Nandu Tendolkar	[46]
85	Chien-Chung Tsai	[16] [17] [18] [19] [20] [21] [26]
86	Hans Tsai	[39]
87	Kun-Han Tsai	[35] [46] [63] [65] [70] [71] [72] [77]
88	Huan-Yung Tseng	[28] [34]
89	Jerzy Tyszer	[47] [49] [55]
90	John A. Waicukauski	[12]
91	Jing Wang	[72]
92	T.-H. Wang	[77]
93	Eleanor Wu	[7] [10]
94	Meng-Fan Wu	[71] [77]
95	Wu Yang	[39]
96	Meng-Lin Yu	[5] [6]
97	Yahya Zaidan	[17] [18] [20] [21]
98	Jing Zeng	[72]
99	Yanping Zhang	[20]
100	Wei Zou	[42] [44] [50] [51]

Colors in the list of coauthors

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