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Kwang-Ting (Tim) Cheng
List of publications from the DBLP Bibliography Server - FAQ
| 2012 | ||
|---|---|---|
| 305 | Peter Lisherness, Kwang-Ting Cheng: Improving validation coverage metrics to account for limited observability. ASP-DAC 2012: 292-297 | |
| 304 | Yan Zheng, Peter Lisherness, Saeed Shamshiri, Amirali Ghofrani, Shiyuan Yang, Kwang-Ting Cheng: Post-fabrication reconfiguration for power-optimized tuning of optically connected multi-core systems. ASP-DAC 2012: 615-620 | |
| 303 | Ming Gao, Peter Lisherness, Kwang-Ting Cheng, Jing-Jia Liou: On error modeling of electrical bugs for post-silicon timing validation. ASP-DAC 2012: 701-706 | |
| 302 | Alex A. T. Bui, Kwang-Ting Cheng, Jason Cong, Luminita A. Vese, Yi-Chu Wang, Bo Yuan, Yi Zou: Platform characterization for Domain-Specific Computing. ASP-DAC 2012: 94-99 | |
| 301 | Yan Zheng, Peter Lisherness, Ming Gao, Jock Bovington, Shiyuan Yang, Kwang-Ting Cheng: Power-efficient calibration and reconfiguration for on-chip optical communication. DATE 2012: 1501-1506 | |
| 2011 | ||
| 300 | Ming Gao, Peter Lisherness, Kwang-Ting (Tim) Cheng: Post-silicon bug detection for variation induced electrical bugs. ASP-DAC 2011: 273-278 | |
| 299 | Hsiu-Ming Chang, Kwang-Ting (Tim) Cheng: Image quality aware metrics for performance specification of ADC array in 3D CMOS imagers. DAC 2011: 759-764 | |
| 298 | Ping-Ying Wang, Hsiu-Ming Chang, Kwang-Ting Cheng: An all-digital built-in self-test technique for transfer function characterization of RF PLLs. DATE 2011: 359-364 | |
| 297 | Xin Yang, Qiong Liu, Chunyuan Liao, Kwang-Ting Cheng, Andreas Girgensohn: Large-scale EMM identification based on geometry-constrained visual word correspondence voting. ICMR 2011: 35 | |
| 296 | Saeed Shamshiri, Amirali Ghofrani, Kwang-Ting Cheng: End-to-end error correction and online diagnosis for on-chip networks. ITC 2011: 1-10 | |
| 295 | Hsiu-Ming Chang, Kwang-Ting Cheng, Wangyang Zhang, Xin Li, Kenneth M. Butler: Test cost reduction through performance prediction using virtual probe. ITC 2011: 1-9 | |
| 294 | Xin Yang, Chunyuan Liao, Qiong Liu, Kwang-Ting Cheng: Minimum correspondence sets for improving large-scale augmented paper. VRCAI 2011: 59-68 | |
| 293 | Jiun-Lang Huang, Kwang-Ting (Tim) Cheng: A Promising Alternative to Conventional Silicon. IEEE Design & Test of Computers 28(6): 6 (2011) | |
| 292 | Tsung-Ching Huang, Jiun-Lang Huang, Kwang-Ting (Tim) Cheng: Robust Circuit Design for Flexible Electronics. IEEE Design & Test of Computers 28(6): 8-15 (2011) | |
| 291 | Saeed Shamshiri, Kwang-Ting (Tim) Cheng: Modeling Yield, Cost, and Quality of a Spare-Enhanced Multicore Chip. IEEE Trans. Computers 60(9): 1246-1259 (2011) | |
| 290 | Ming Gao, Hsiu-Ming Chang, Peter Lisherness, Kwang-Ting (Tim) Cheng: Time-Multiplexed Online Checking. IEEE Trans. Computers 60(9): 1300-1312 (2011) | |
| 289 | Hsiu-Ming Chang, Kuan-Yu Lin, Kwang-Ting (Tim) Cheng: Tester-Assisted Calibration and Screening for Digitally-Calibrated ADCs. IEEE Trans. on Circuits and Systems 58-I(12): 2838-2848 (2011) | |
| 288 | Mei-Chen Yeh, Kwang-Ting Cheng: Fast Visual Retrieval Using Accelerated Sequence Matching. IEEE Transactions on Multimedia 13(2): 320-329 (2011) | |
| 2010 | ||
| 287 | Dongwoo Hong, Kwang-Ting Cheng: Efficient Test Methodologies for High-Speed Serial Links Springer 2010: 1-90 | |
| 286 | Yi-Chu Wang, Sydney Pang, Kwang-Ting Cheng: A GPU-accelerated face annotation system for smartphones. ACM Multimedia 2010: 1667-1668 | |
| 285 | Peter Lisherness, Kwang-Ting (Tim) Cheng: SCEMIT: a systemc error and mutation injection tool. DAC 2010: 228-233 | |
| 284 | Hsiu-Ming Chang, Jiun-Lang Huang, Ding-Ming Kwai, Kwang-Ting (Tim) Cheng, Cheng-Wen Wu: An error tolerance scheme for 3D CMOS imagers. DAC 2010: 917-922 | |
| 283 | Chun-Ming Lo, Tsung-Ching Huang, Cheng-Yi Chiang, J. Hou, Kwang-Ting Cheng: A portable multi-pitch e-drum based on printed flexible pressure sensors. DATE 2010: 1082-1087 | |
| 282 | Tsung-Ching Huang, Kenjiro Fukuda, Chun-Ming Lo, Yung-Hui Yeh, Tsuyoshi Sekitani, Takao Someya, Kwang-Ting Cheng: Pseudo-CMOS: A novel design style for flexible electronics. DATE 2010: 154-159 | |
| 281 | Mohamed Abbas, Kwang-Ting Cheng, Yasuo Furukawa, Satoshi Komatsu, Kunihiro Asada: An automatic test generation framework for digitally-assisted adaptive equalizers in high-speed serial links. DATE 2010: 1755-1760 | |
| 280 | Ming Gao, Kwang-Ting Cheng: A case study of Time-Multiplexed Assertion Checking for post-silicon debugging. HLDVT 2010: 90-96 | |
| 279 | Saeed Shamshiri, Kwang-Ting Cheng: Error-locality-aware linear coding to correct multi-bit upsets in SRAMs. ITC 2010: 202-211 | |
| 278 | Huawei Li, Dawen Xu, Yinhe Han, Kwang-Ting Cheng, Xiaowei Li: nGFSIM : A GPU-based fault simulator for 1-to-n detection and its applications. ITC 2010: 343-352 | |
| 277 | Shujun Deng, Kwang-Ting Cheng, Jinian Bian, Zhiqiu Kong: Mutation-based diagnostic test generation for hardware design error diagnosis. ITC 2010: 815 | |
| 276 | Saeed Shamshiri, Kwang-Ting Cheng: Modeling yield, cost, and quality of an NoC with uniformly and non-uniformly distributed redundancy. VTS 2010: 194-199 | |
| 275 | Hsiu-Ming Chang, Kuan-Yu Lin, Kwang-Ting Cheng: Calibration-assisted production testing for digitally-calibrated ADCs. VTS 2010: 295-300 | |
| 274 | Kwang-Ting Cheng: Innovative practices session 2C: Design, fabrication and test of flexible electronics. VTS 2010: 81 | |
| 273 | Kwang-Ting Cheng, Tsung-Ching Huang: Design, analysis, and test of low-power and reliable flexible electronics. VTS 2010: 82 | |
| 272 | Hsiu-Ming Chang, Kuan-Yu Lin, Kwang-Ting (Tim) Cheng: Calibration and Test Time Reduction Techniques for Digitally-Calibrated Designs: an ADC Case Study. J. Electronic Testing 26(1): 59-71 (2010) | |
| 2009 | ||
| 271 | Xin Yang, Qiang Zhu, Kwang-Ting Cheng: MyFinder: near-duplicate detection for large image collections. ACM Multimedia 2009: 1013-1014 | |
| 270 | Mei-Chen Yeh, Kwang-Ting Cheng: A compact, effective descriptor for video copy detection. ACM Multimedia 2009: 633-636 | |
| 269 | Ming Gao, Kwang-Ting Cheng: Low Overhead Time-Multiplexed Online Checking: A Case Study of An H.264 Decoder. Asian Test Symposium 2009: 119-124 | |
| 268 | Hsiu-Ming Chang, Kuan-Yu Lin, Kwang-Ting Cheng: Calibration as a Functional Test: An ADC Case Study. Asian Test Symposium 2009: 85-86 | |
| 267 | Kwang-Ting Cheng, Hsiu-Ming Chang: Test strategies for adaptive equalizers. CICC 2009: 597-604 | |
| 266 | Mei-Chen Yeh, Kwang-Ting Cheng: Video copy detection by fast sequence matching. CIVR 2009 | |
| 265 | Mohamed Abbas, Kwang-Ting Cheng, Yasuo Furukawa, Satoshi Komatsu, Kunihiro Asada: Signature-Based Testing for Digitally-Assisted Adaptive Equalizers in High-Speed Serial Links. European Test Symposium 2009: 107-112 | |
| 264 | Peter Lisherness, Kwang-Ting Cheng: An instrumented observability coverage method for system validation. HLDVT 2009: 88-93 | |
| 263 | Hsiu-Ming Chang, Kuan-Yu Lin, Chin-Hsuan Chen, Kwang-Ting Cheng: A Built-in self-calibration scheme for pipelined ADCs. ISQED 2009: 266-271 | |
| 262 | Saeed Shamshiri, Kwang-Ting Cheng: Yield and Cost Analysis of a Reliable NoC. VTS 2009: 173-178 | |
| 261 | Dong Xiang, Boxue Yin, Kwang-Ting Cheng: Dynamic Test Compaction for Transition Faults in Broadside Scan Testing Based on an Influence Cone Measure. VTS 2009: 251-256 | |
| 260 | Hsiu-Ming Chang, Chin-Hsuan Chen, Kuan-Yu Lin, Kwang-Ting Cheng: Calibration and Testing Time Reduction Techniques for a Digitally-Calibrated Pipelined ADC. VTS 2009: 291-296 | |
| 259 | Feng Lu, Kwang-Ting Cheng: SEChecker: A Sequential Equivalence Checking Framework Based on Kth Invariants. IEEE Trans. VLSI Syst. 17(6): 733-746 (2009) | |
| 2008 | ||
| 258 | Shih-Wei Chu, Mei-Chen Yeh, Kwang-Ting Cheng: A real-time, embedded face-annotation system. ACM Multimedia 2008: 989-990 | |
| 257 | Saeed Shamshiri, Peter Lisherness, Sung-Jui (Song-Ra) Pan, Kwang-Ting Cheng: A Cost Analysis Framework for Multi-core Systems with Spares. ITC 2008: 1-8 | |
| 256 | Saeed Mirzaeian, Feijun (Frank) Zheng, Kwang-Ting (Tim) Cheng: RTL Error Diagnosis Using a Word-Level SAT-Solver. ITC 2008: 1-8 | |
| 255 | Mei-Chen Yeh, Kwang-Ting Cheng: A string matching approach for visual retrieval and classification. Multimedia Information Retrieval 2008: 52-58 | |
| 254 | Dongwoo Hong, Kwang-Ting (Tim) Cheng: Bit-Error Rate Estimation for Bang-Bang Clock and Data Recovery Circuit in High-Speed Serial Links. VTS 2008: 17-22 | |
| 253 | Laung-Terng Wang, Charles E. Stroud, Kwang-Ting (Tim) Cheng: Logic Testing. Wiley Encyclopedia of Computer Science and Engineering 2008 | |
| 252 | Kwang-Ting (Tim) Cheng: From the EIC. IEEE Design & Test of Computers 25(1): 4 (2008) | |
| 251 | Kwang-Ting (Tim) Cheng: Test compression saves bits, cycles, and money. IEEE Design & Test of Computers 25(2): 105 (2008) | |
| 250 | Kwang-Ting (Tim) Cheng: Effective silicon debug is key for time to money. IEEE Design & Test of Computers 25(3): 204 (2008) | |
| 249 | Kwang-Ting (Tim) Cheng: Not just research as usual. IEEE Design & Test of Computers 25(4): 292 (2008) | |
| 248 | Kwang-Ting (Tim) Cheng: Design and test for reliability and efficiency. IEEE Design & Test of Computers 25(6): 508 (2008) | |
| 247 | Chee-Kian Ong, Dongwoo Hong, Kwang-Ting Cheng, Li-C. Wang: A Clock-Less Jitter Spectral Analysis Technique. IEEE Trans. on Circuits and Systems 55-I(8): 2263-2272 (2008) | |
| 246 | Tsung-Ching Huang, Kwang-Ting (Tim) Cheng, Huai-Yuan Tseng, Chen-Pang Kung: Reliability analysis for flexible electronics: Case study of integrated a-Si: H TFT scan driver. JETC 4(3): (2008) | |
| 2007 | ||
| 245 | Tsung-Ching Huang, Huai-Yuan Tseng, Chen-Pang Kung, Kwang-Ting Cheng: Reliability Analysis for Flexible Electronics: Case Study of Integrated a-Si: H TFT Scan Driver. DAC 2007: 966-969 | |
| 244 | Dongwoo Hong, Shadi Saberi, Kwang-Ting Cheng, C. Patrick Yue: A two-tone test method for continuous-time adaptive equalizers. DATE 2007: 1283-1288 | |
| 243 | Sung-Jui (Song-Ra) Pan, Kwang-Ting Cheng: A framework for system reliability analysis considering both system error tolerance and component test quality. DATE 2007: 1581-1586 | |
| 242 | Mitchell Lin, Kwang-Ting (Tim) Cheng: Testable design for advanced serial-link transceivers. DATE 2007: 695-700 | |
| 241 | Mango Chia-Tso Chao, Kwang-Ting Cheng, Seongmoon Wang, Srimat T. Chakradhar, Wenlong Wei: A hybrid scheme for compacting test responses with unknown values. ICCAD 2007: 513-519 | |
| 240 | Jin-Fu Li, Feijun (Frank) Zheng, Kwang-Ting Cheng: Diagnosing scan chains using SAT-based diagnostic pattern generation. SoCC 2007: 273-276 | |
| 239 | Kwang-Ting (Tim) Cheng: Moore's law meets the life sciences. IEEE Design & Test of Computers 24(1): 4 (2007) | |
| 238 | Kwang-Ting (Tim) Cheng: Cocktail approach to functional verification. IEEE Design & Test of Computers 24(2): 108 (2007) | |
| 237 | Kwang-Ting (Tim) Cheng: Supporting cost-effective innovation. IEEE Design & Test of Computers 24(3): 212 (2007) | |
| 236 | Kwang-Ting (Tim) Cheng: Design and CAD for Nanotechnologies. IEEE Design & Test of Computers 24(4): 300 (2007) | |
| 235 | Kwang-Ting (Tim) Cheng: Combining synchronous and asynchronous timing schemes for high-performance systems. IEEE Design & Test of Computers 24(5): 412 (2007) | |
| 234 | Kwang-Ting (Tim) Cheng: Trustworthy ICs for secure embedded computing. IEEE Design & Test of Computers 24(6): 516 (2007) | |
| 233 | Kai Yang, Kwang-Ting Cheng: Silicon Debug for Timing Errors. IEEE Trans. on CAD of Integrated Circuits and Systems 26(11): 2084-2088 (2007) | |
| 232 | Yung-Chieh Lin, Feng Lu, Kwang-Ting Cheng: Multiple-Fault Diagnosis Based On Adaptive Diagnostic Test Pattern Generation. IEEE Trans. on CAD of Integrated Circuits and Systems 26(5): 932-942 (2007) | |
| 2006 | ||
| 231 | Qiang Zhu, Mei-Chen Yeh, Kwang-Ting Cheng: Multimodal fusion using learned text concepts for image categorization. ACM Multimedia 2006: 211-220 | |
| 230 | Sung-Jui (Song-Ra) Pan, Kwang-Ting Cheng, John Moondanos, Ziyad Hanna: Generation of shorter sequences for high resolution error diagnosis using sequential SAT. ASP-DAC 2006: 25-29 | |
| 229 | Kai Yang, Kwang-Ting Cheng: Efficient identification of multi-cycle false path. ASP-DAC 2006: 360-365 | |
| 228 | Qiang Zhu, Mei-Chen Yeh, Kwang-Ting Cheng, Shai Avidan: Fast Human Detection Using a Cascade of Histograms of Oriented Gradients. CVPR (2) 2006: 1491-1498 | |
| 227 | Mango Chia-Tso Chao, Kwang-Ting Cheng, Seongmoon Wang, Srimat T. Chakradhar, Wenlong Wei: Unknown-tolerance analysis and test-quality control for test response compaction using space compactors. DAC 2006: 1083-1088 | |
| 226 | Mango Chia-Tso Chao, Seongmoon Wang, Srimat T. Chakradhar, Wenlong Wei, Kwang-Ting Cheng: Coverage loss by using space compactors in presence of unknown values. DATE 2006: 1053-1054 | |
| 225 | Kai Yang, Kwang-Ting Cheng: Timing-reasoning-based delay fault diagnosis. DATE 2006: 418-423 | |
| 224 | Yung-Chieh Lin, Kwang-Ting Cheng: Multiple-fault diagnosis based on single-fault activation and single-output observation. DATE 2006: 424-429 | |
| 223 | Yung-Chieh Lin, Kwang-Ting Cheng: A Unified Approach to Test Generation and Test Data Volume Reduction. ITC 2006: 1-10 | |
| 222 | Dongwoo Hong, Kwang-Ting Cheng: Bit Error Rate Estimation for Improving Jitter Testing of High-Speed Serial Links. ITC 2006: 1-10 | |
| 221 | Mitchell Lin, Kwang-Ting Cheng: Testable Design for Adaptive Linear Equalizer in High-Speed Serial Links. ITC 2006: 1-10 | |
| 220 | Kwang-Ting Cheng: New beginnings, continued success. IEEE Design & Test of Computers 23(1): 5-6 (2006) | |
| 219 | Kaushik Roy, T. M. Mak, Kwang-Ting (Tim) Cheng: Test Consideration for Nanometer-Scale CMOS Circuits. IEEE Design & Test of Computers 23(2): 128-136 (2006) | |
| 218 | Kwang-Ting (Tim) Cheng: Dealing with early life failures. IEEE Design & Test of Computers 23(2): 85 (2006) | |
| 217 | Kwang-Ting (Tim) Cheng: The Need for a SiP Design and Test Infrastructure. IEEE Design & Test of Computers 23(3): 181 (2006) | |
| 216 | Kwang-Ting (Tim) Cheng: Vision from the Top. IEEE Design & Test of Computers 23(4): 261 (2006) | |
| 215 | Kwang-Ting (Tim) Cheng: The New World of ESL Design. IEEE Design & Test of Computers 23(5): 333 (2006) | |
| 214 | Kwang-Ting (Tim) Cheng: Handling variations and uncertainties. IEEE Design & Test of Computers 23(6): 434 (2006) | |
| 213 | Charles H.-P. Wen, Li-C. Wang, Kwang-Ting Cheng: Simulation-Based Functional Test Generation for Embedded Processors. IEEE Trans. Computers 55(11): 1335-1343 (2006) | |
| 212 | Yung-Chieh Lin, Feng Lu, Kwang-Ting Cheng: Pseudofunctional testing. IEEE Trans. on CAD of Integrated Circuits and Systems 25(8): 1535-1546 (2006) | |
| 211 | Salvador Mir, Kwang-Ting (Tim) Cheng, Andrew Richardson: Guest Editorial. J. Electronic Testing 22(4-6): 311 (2006) | |
| 2005 | ||
| 210 | Yung-Chieh Lin, Feng Lu, Kai Yang, Kwang-Ting Cheng: Constraint extraction for pseudo-functional scan-based delay testing. ASP-DAC 2005: 166-171 | |
| 209 | Ganapathy Parthasarathy, Madhu K. Iyer, Kwang-Ting Cheng, Forrest Brewer: Structural search for RTL with predicate learning. DAC 2005: 451-456 | |
| 208 | Feng Lu, Madhu K. Iyer, Ganapathy Parthasarathy, Li-C. Wang, Kwang-Ting Cheng, Kuang-Chien Chen: An Efficient Sequential SAT Solver With Improved Search Strategies. DATE 2005: 1102-1107 | |
| 207 | Madhu K. Iyer, Ganapathy Parthasarathy, Kwang-Ting Cheng: Efficient Conflict-Based Learning in an RTL Circuit Constraint Solver. DATE 2005: 666-671 | |
| 206 | Ganapathy Parthasarathy, Madhu K. Iyer, Kwang-Ting Cheng, Forrest Brewer: RTL SAT simplification by Boolean and interval arithmetic reasoning. ICCAD 2005: 297-302 | |
| 205 | Mango Chia-Tso Chao, Seongmoon Wang, Srimat T. Chakradhar, Kwang-Ting Cheng: Response shaper: a novel technique to enhance unknown tolerance for output response compaction. ICCAD 2005: 80-87 | |
| 204 | Mango Chia-Tso Chao, Seongmoon Wang, Srimat T. Chakradhar, Kwang-Ting Cheng: ChiYun Compact: A Novel Test Compaction Technique for Responses with Unknown Values. ICCD 2005: 147-152 | |
| 203 | Yung-Chieh Lin, Feng Lu, Kwang-Ting Cheng: Accurate Diagnosis of Multiple Faults. ICCD 2005: 153-156 | |
| 202 | Qiang Zhu, Shai Avidan, Kwang-Ting Cheng: Learning a Sparse, Corner-Based Representation for Time-varying Background Modeling. ICCV 2005: 678-685 | |
| 201 | Ching-Tung Wu, Kwang-Ting Cheng, Qiang Zhu, Yi-Leh Wu: Using visual features for anti-spam filtering. ICIP (3) 2005: 509-512 | |
| 200 | Mitchell Lin, Kwang-Ting Cheng, Jimmy Hsu, M. C. Sun, Jason Chen, Shelton Lu: Production-oriented interface testing for PCI-Express by enhanced loop-back technique. ITC 2005: 10 | |
| 199 | Charles H.-P. Wen, Li-C. Wang, Kwang-Ting Cheng, Wei-Ting Liu, Ji-Jan Chen: Simulation-based target test generation techniques for improving the robustness of a software-based-self-test methodology. ITC 2005: 10 | |
| 198 | Charles H.-P. Wen, Li-C. Wang, Kwang-Ting Cheng, Kai Yang, Wei-Ting Liu, Ji-Jan Chen: On A Software-Based Self-Test Methodology and Its Application. VTS 2005: 107-113 | |
| 197 | Yung-Chieh Lin, Feng Lu, Kwang-Ting Cheng: Pseudo-Functional Scan-based BIST for Delay Fault. VTS 2005: 229-234 | |
| 196 | Tao Feng, Li-C. Wang, Kwang-Ting Cheng, Chih-Chan Lin: Using 2-domain partitioned OBDD data structure in an enhanced symbolic simulator. ACM Trans. Design Autom. Electr. Syst. 10(4): 627-650 (2005) | |
| 2004 | ||
| 195 | Qiang Zhu, Ching-Tung Wu, Kwang-Ting Cheng, Yi-Leh Wu: An adaptive skin model and its application to objectionable image filtering. ACM Multimedia 2004: 56-63 | |
| 194 | Chee-Kian Ong, Dongwoo Hong, Kwang-Ting Cheng, Li-C. Wang: Jitter spectral extraction for multi-gigahertz signal. ASP-DAC 2004: 298-303 | |
| 193 | Ganapathy Parthasarathy, Madhu K. Iyer, Kwang-Ting Cheng, Li-C. Wang: Efficient reachability checking using sequential SAT. ASP-DAC 2004: 418-423 | |
| 192 | Tao Feng, Li-C. Wang, Kwang-Ting Cheng: Improved symbolic simulation by functional-space decomposition. ASP-DAC 2004: 634-639 | |
| 191 | Kai Yang, Kwang-Ting Cheng, Li-C. Wang: TranGen: a SAT-based ATPG for path-oriented transition faults. ASP-DAC 2004: 92-97 | |
| 190 | Hao-Chiao Hong, Cheng-Wen Wu, Kwang-Ting Cheng: A Signa-Delta Modulation Based Analog BIST System with a Wide Bandwidth Fifth-Order Analog Response Extractor for Diagnosis Purpose. Asian Test Symposium 2004: 62-67 | |
| 189 | Ganapathy Parthasarathy, Madhu K. Iyer, Kwang-Ting Cheng, Li-C. Wang: An efficient finite-domain constraint solver for circuits. DAC 2004: 212-217 | |
| 188 | Li-C. Wang, T. M. Mak, Kwang-Ting Cheng, Magdy S. Abadir: On path-based learning and its applications in delay test and diagnosis. DAC 2004: 492-497 | |
| 187 | Mango Chia-Tso Chao, Li-C. Wang, Kwang-Ting Cheng: Pattern Selection for Testing of Deep Sub-Micron Timing Defects. DATE 2004: 160 | |
| 186 | Chee-Kian Ong, Dongwoo Hong, Kwang-Ting Cheng, Li-C. Wang: Random Jitter Extraction Technique in a Multi-Gigahertz Signal. DATE 2004: 286-291 | |
| 185 | Tao Feng, Li-C. Wang, Kwang-Ting Cheng, Chih-Chan Lin: Improved Symoblic Simulation by Dynamic Funtional Space Partitioning. DATE 2004: 42-49 | |
| 184 | Qiang Zhu, Kwang-Ting Cheng, Ching-Tung Wu, Yi-Leh Wu: Adaptive Learning of an Accurate Skin-Color Model. FGR 2004: 37-42 | |
| 183 | Rob A. Rutenbar, Li-C. Wang, Kwang-Ting Cheng, Sandip Kundu: Static statistical timing analysis for latch-based pipeline designs. ICCAD 2004: 468-472 | |
| 182 | Leonard Lee, Li-C. Wang, T. M. Mak, Kwang-Ting Cheng: A path-based methodology for post-silicon timing validation. ICCAD 2004: 713-720 | |
| 181 | Qiang Zhu, Kwang-Ting Cheng, Ching-Tung Wu: A unified adaptive approach to accurate skin detection. ICIP 2004: 1189-1192 | |
| 180 | Qiang Zhu, Kwang-Ting Cheng, HongJiang Zhang: SSD tracking using dynamic template and log-polar transformation. ICME 2004: 723-726 | |
| 179 | Dongwoo Hong, Chee-Kian Ong, Kwang-Ting (Tim) Cheng: BER Estimation for Serial Links Based on Jitter Spectrum and Clock Recovery Characteristics. ITC 2004: 1138-1147 | |
| 178 | Chee-Kian Ong, Dongwoo Hong, Kwang-Ting Cheng, Li-C. Wang: A Scalable On-Chip Jitter Extraction Technique. VTS 2004: 267-272 | |
| 177 | Ganapathy Parthasarathy, Madhu K. Iyer, Kwang-Ting Cheng, Li-C. Wang: Safety Property Verification Using Sequential SAT and Bounded Model Checking. IEEE Design & Test of Computers 21(2): 132-143 (2004) | |
| 176 | T. M. Mak, Angela Krstic, Kwang-Ting (Tim) Cheng, Li-C. Wang: New Challenges in Delay Testing of Nanometer, Multigigahertz Designs. IEEE Design & Test of Computers 21(3): 241-247 (2004) | |
| 175 | Li-C. Wang, Jing-Jia Liou, Kwang-Ting Cheng: Critical path selection for delay fault testing based upon a statistical timing model. IEEE Trans. on CAD of Integrated Circuits and Systems 23(11): 1550-1565 (2004) | |
| 174 | Ying-Tsai Chang, Kwang-Ting Cheng: Self-referential verification for gate-level implementations of arithmetic circuits. IEEE Trans. on CAD of Integrated Circuits and Systems 23(7): 1102-1112 (2004) | |
| 173 | Feng Lu, Li-C. Wang, Kwang-Ting (Tim) Cheng, John Moondanos, Ziyad Hanna: A Signal Correlation Guided Circuit-SAT Solver. J. UCS 10(12): 1629-1654 (2004) | |
| 2003 | ||
| 172 | Feng Lu, Li-C. Wang, Kwang-Ting Cheng, John Moondanos, Ziyad Hanna: A signal correlation guided ATPG solver and its applications for solving difficult industrial cases. DAC 2003: 436-441 | |
| 171 | Angela Krstic, Li-C. Wang, Kwang-Ting Cheng, Jing-Jia Liou, T. M. Mak: Enhancing diagnosis resolution for delay defects based upon statistical timing and statistical fault models. DAC 2003: 668-673 | |
| 170 | Angela Krstic, Li-C. Wang, Kwang-Ting Cheng, Jing-Jia Liou, Magdy S. Abadir: Delay Defect Diagnosis Based Upon Statistical Timing Models - The First Step. DATE 2003: 10328-10335 | |
| 169 | Feng Lu, Li-C. Wang, Kwang-Ting Cheng, Ric C.-Y. Huang: A Circuit SAT Solver With Signal Correlation Guided Learning. DATE 2003: 10892-10897 | |
| 168 | Madhu K. Iyer, Ganapathy Parthasarathy, Kwang-Ting Cheng: SATORI - A Fast Sequential SAT Engine for Circuits. ICCAD 2003: 320-325 | |
| 167 | Angela Krstic, Jing-Jia Liou, Kwang-Ting Cheng, Li-C. Wang: On Structural vs. Functional Testing for Delay Faults. ISQED 2003: 438-441 | |
| 166 | Li-C. Wang, Angela Krstic, Leonard Lee, Kwang-Ting Cheng, M. Ray Mercer, Thomas W. Williams, Magdy S. Abadir: Using Logic Models To Predict The Detection Behavior Of Statistical Timing Defects. ITC 2003: 1041-1050 | |
| 165 | Kwang-Ting Cheng: The Confluence of Manufacturing Test and Design Validation. ITC 2003: 1293 | |
| 164 | Angela Krstic, Li-C. Wang, Kwang-Ting Cheng, T. M. Mak: Diagnosis-Based Post-Silicon Timing Validation Using Statistical Tools and Methodologies. ITC 2003: 339-348 | |
| 163 | Kaushik Roy, T. M. Mak, Kwang-Ting Cheng: Embedded Tutorial: Test Consideration for Nanometer Scale CMOS Circuits. VTS 2003: 313-318 | |
| 162 | Angela Krstic, Li-C. Wang, Kwang-Ting Cheng, Jing-Jia Liou: Diagnosis of Delay Defects Using Statistical Timing Models. VTS 2003: 339-344 | |
| 161 | Li-C. Wang, Tao Feng, Kwang-Ting (Tim) Cheng, Magdy S. Abadir, Manish Pandey: Enhanced Symbolic Simulation for Functional Verification of Embedded Array Systems. Design Autom. for Emb. Sys. 8(2-3): 173-188 (2003) | |
| 160 | Kenneth M. Butler, Kwang-Ting (Tim) Cheng, Li-C. Wang: Guest Editors' Introduction: Speed Test and Speed Binning for Complex ICs. IEEE Design & Test of Computers 20(5): 6-7 (2003) | |
| 159 | Jing-Jia Liou, Angela Krstic, Yi-Min Jiang, Kwang-Ting Cheng: Modeling, testing, and analysis for delay defects and noise effects in deep submicron devices. IEEE Trans. on CAD of Integrated Circuits and Systems 22(6): 756-769 (2003) | |
| 2002 | ||
| 158 | Wei-Cheng Lai, Chengwei Chang, Edward Y. Chang, Kwang-Ting Cheng, Michael Crandell: PBIR-MM: multimodal image retrieval and annotation. ACM Multimedia 2002: 421-422 | |
| 157 | Hao-Chiao Hong, Jiun-Lang Huang, Kwang-Ting Cheng, Cheng-Wen Wu: On-chip Analog Response Extraction with 1-Bit ? - Modulators. Asian Test Symposium 2002: 49- | |
| 156 | Ying-Tsai Chang, Kwang-Ting Cheng: Self-referential verification of gate-level implementations of arithmetic circuits. DAC 2002: 311-316 | |
| 155 | Angela Krstic, Wei-Cheng Lai, Kwang-Ting Cheng, Li Chen, Sujit Dey: Embedded software-based self-testing for SoC design. DAC 2002: 355-360 | |
| 154 | Jing-Jia Liou, Li-C. Wang, Kwang-Ting Cheng, Jennifer Dworak, M. Ray Mercer, Rohit Kapur, Thomas W. Williams: Enhancing test efficiency for delay fault testing using multiple-clocked schemes. DAC 2002: 371-374 | |
| 153 | Jing-Jia Liou, Angela Krstic, Li-C. Wang, Kwang-Ting Cheng: False-path-aware statistical timing analysis and efficient path selection for delay testing and timing validation. DAC 2002: 566-569 | |
| 152 | Jing-Jia Liou, Li-C. Wang, Kwang-Ting Cheng: On theoretical and practical considerations of path selection for delay fault testing. ICCAD 2002: 94-100 | |
| 151 | Yi-Leh Wu, Edward Y. Chang, Kwang-Ting Cheng, Chengwei Chang, Chen-Cha Hsu, Wei-Cheng Lai, Ching-Tung Wu: MORF: A Distributed Multimodal Information Filtering System. IEEE Pacific Rim Conference on Multimedia 2002: 279-286 | |
| 150 | Wei-Cheng Lai, Edward Y. Chang, Kwang-Ting Cheng: Hybrid Learning Schemes for Multimedia Information Retrieval. IEEE Pacific Rim Conference on Multimedia 2002: 556-563 | |
| 149 | Ganapathy Parthasarathy, Madhu K. Iyer, Tao Feng, Li-C. Wang, Kwang-Ting Cheng, Magdy S. Abadir: Combining ATPG and Symbolic Simulation for Efficient Validation of Embedded Array Systems. ITC 2002: 203-212 | |
| 148 | Jing-Jia Liou, Li-C. Wang, Kwang-Ting Cheng, Jennifer Dworak, M. Ray Mercer, Rohit Kapur, Thomas W. Williams: Analysis of Delay Test Effectiveness with a Multiple-Clock Scheme. ITC 2002: 407-416 | |
| 147 | Chee-Kian Ong, Kwang-Ting (Tim) Cheng: Self-Testing Second-Order Delta-Sigma Modulators Using Digital Stimulus. VTS 2002: 123-128 | |
| 146 | Madhu K. Iyer, Kwang-Ting Cheng: Software-Based Weighted Random Testing for IP Cores in Bus-Based Programmable SoCs. VTS 2002: 139-144 | |
| 145 | Angela Krstic, Wei-Cheng Lai, Kwang-Ting Cheng, Li Chen, Sujit Dey: Embedded Software-Based Self-Test for Programmable Core-Based Designs. IEEE Design & Test of Computers 19(4): 18-27 (2002) | |
| 2001 | ||
| 144 | Edward Y. Chang, Kwang-Ting Cheng, Wei-Cheng Lai, Ching-Tung Wu, Chengwei Chang, Yi-Leh Wu: PBIR: perception-based image retrieval-a system that can quickly capture subjective image query concepts. ACM Multimedia 2001: 611-614 | |
| 143 | Kingshy Goh, Edward Y. Chang, Kwang-Ting Cheng: SVM Binary Classifier Ensembles for Image Classification. CIKM 2001: 395-402 | |
| 142 | Wei-Cheng Lai, Kwang-Ting Cheng: Instruction-Level DFT for Testing Processor and IP Cores in System-on-a-Chip. DAC 2001: 59-64 | |
| 141 | Jing-Jia Liou, Kwang-Ting Cheng, Sandip Kundu, Angela Krstic: Fast Statistical Timing Analysis By Probabilistic Event Propagation. DAC 2001: 661-666 | |
| 140 | Ying-Tsai Chang, Kwang-Ting Cheng: Induction-Based Gate-Level Verification of Multipliers. ICCAD 2001: 190- | |
| 139 | Beitao Li, Wei-Cheng Lai, Edward Y. Chang, Kwang-Ting Cheng: Mining Image Features for Efficient Query Processing. ICDM 2001: 353-360 | |
| 138 | Yi-Min Jiang, Han Young Koh, Kwang-Ting Cheng: HRM - A Hierarchical Simulator for Full-Chip Power Network Reliability Analysis. ISQED 2001: 307-312 | |
| 137 | Angela Krstic, Jing-Jia Liou, Yi-Min Jiang, Kwang-Ting Cheng: Delay testing considering crosstalk-induced effects. ITC 2001: 558-567 | |
| 136 | Edward Y. Chang, Kwang-Ting (Tim) Cheng, Lihyuarn L. Chang: PBIR - Perception-Based Image Retrieval. SIGMOD Conference 2001: 613 | |
| 135 | Jing-Reng Huang, Madhu K. Iyer, Kwang-Ting Cheng: A Self-Test Methodology for IP Cores in Bus-Based Programmable SoCs. VTS 2001: 198-203 | |
| 134 | Wei-Cheng Lai, Jing-Reng Huang, Kwang-Ting (Tim) Cheng: Embedded-Software-Based Approach to Testing Crosstalk-Induced Faults at On-Chip Buses. VTS 2001: 204-209 | |
| 133 | Jiun-Lang Huang, Kwang-Ting Cheng: An On-Chip Short-Time Interval Measurement Technique for Testing High-Speed Communication Links. VTS 2001: 380-387 | |
| 132 | Shi-Yu Huang, Kwang-Ting Cheng, Kuang-Chien Chen: Verifying sequential equivalence using ATPG techniques. ACM Trans. Design Autom. Electr. Syst. 6(2): 244-275 (2001) | |
| 131 | Yi-Min Jiang, Kwang-Ting Cheng: Vector generation for power supply noise estimation and verification of deep submicron designs. IEEE Trans. VLSI Syst. 9(2): 329-340 (2001) | |
| 130 | Chung-Yang Huang, Kwang-Ting Cheng: Using word-level ATPG and modular arithmetic constraint-solvingtechniques for assertion property checking. IEEE Trans. on CAD of Integrated Circuits and Systems 20(3): 381-391 (2001) | |
| 129 | Angela Krstic, Yi-Min Jiang, Kwang-Ting Cheng: Pattern generation for delay testing and dynamic timing analysisconsidering power-supply noise effects. IEEE Trans. on CAD of Integrated Circuits and Systems 20(3): 416-425 (2001) | |
| 2000 | ||
| 128 | Jing-Jia Liou, Angela Krstic, Kwang-Ting Cheng, Deb Aditya Mukherjee, Sandip Kundu: Performance sensitivity analysis using statistical method and its applications to delay. ASP-DAC 2000: 587-592 | |
| 127 | Huan-Chih Tsai, Kwang-Ting Cheng, Vishwani D. Agrawal: A testability metric for path delay faults and its application. ASP-DAC 2000: 593-598 | |
| 126 | Jiun-Lang Huang, Kwang-Ting Cheng: A sigma-delta modulation based BIST scheme for mixed-signal circuits. ASP-DAC 2000: 605-612 | |
| 125 | Kwang-Ting Cheng, Vishwani D. Agrawal, Jing-Yang Jou, Li-C. Wang, Chi-Feng Wu, Shianling Wu: Collaboration between Industry and Academia in Test Research. Asian Test Symposium 2000: 17- | |
| 124 | Vishwani D. Agrawal, Kwang-Ting Cheng: Testing in the Fourth Dimension. Asian Test Symposium 2000: 2- | |
| 123 | Melvin A. Breuer, Kwang-Ting Cheng: Challenges for the Academic Test Community. Asian Test Symposium 2000: 4- | |
| 122 | Jing-Reng Huang, Chee-Kian Ong, Kwang-Ting Cheng, Cheng-Wen Wu: An FPGA-based re-configurable functional tester for memory chips. Asian Test Symposium 2000: 51-57 | |
| 121 | Chung-Yang Huang, Kwang-Ting Cheng: Assertion checking by combined word-level ATPG and modular arithmetic constraint-solving techniques. DAC 2000: 118-123 | |
| 120 | Kwang-Ting Cheng, Sujit Dey, Mike Rodgers, Kaushik Roy: Test challenges for deep sub-micron technologies. DAC 2000: 142-149 | |
| 119 | Jiun-Lang Huang, Chee-Kian Ong, Kwang-Ting Cheng: A BIST Scheme for On-Chip ADC and DAC Testing. DATE 2000: 216-220 | |
| 118 | Jing-Jia Liou, Angela Krstic, Yi-Min Jiang, Kwang-Ting Cheng: Path Selection and Pattern Generation for Dynamic Timing Analysis Considering Power Supply Noise Effects. ICCAD 2000: 493-496 | |
| 117 | Yi-Min Jiang, Angela Krstic, Kwang-Ting Cheng: Dynamic Timing Analysis Considering Power Supply Noise Effects. ISQED 2000: 137-144 | |
| 116 | Jiun-Lang Huang, Kwang-Ting Cheng: Testing and characterization of the one-bit first-order delta-sigma modulator for on-chip analog signal analysis. ITC 2000: 1021-1030 | |
| 115 | Wei-Cheng Lai, Angela Krstic, Kwang-Ting Cheng: Test program synthesis for path delay faults in microprocessor cores. ITC 2000: 1080-1089 | |
| 114 | Subrata Roy, Gokhan Guner, Kwang-Ting Cheng: Efficient test mode selection and insertion for RTL-BIST. ITC 2000: 263-272 | |
| 113 | Chung-Yang Huang, Bwolen Yang, Huan-Chih Tsai, Kwang-Ting Cheng: Static property checking using ATPG vs. BDD techniques. ITC 2000: 309-316 | |
| 112 | Wei-Cheng Lai, Angela Krstic, Kwang-Ting Cheng: On Testing the Path Delay Faults of a Microprocessor Using its Instruction Set. VTS 2000: 15-22 | |
| 111 | Jan Arild Tofte, Chee-Kian Ong, Jiun-Lang Huang, Kwang-Ting (Tim) Cheng: Characterization of a Pseudo-Random Testing Technique for Analog and Mixed-Signal Built-in-Self-Test. VTS 2000: 237-246 | |
| 110 | Jing-Jia Liou, Kwang-Ting Cheng, Deb Aditya Mukherjee: Path Selection for Delay Testing of Deep Sub-Micron Devices Using Statistical Performance Sensitivity Analysis. VTS 2000: 97-104 | |
| 109 | Wei-Cheng Lai, Angela Krstic, Kwang-Ting (Tim) Cheng: Functionally Testable Path Delay Faults on a Microprocessor. IEEE Design & Test of Computers 17(4): 6-14 (2000) | |
| 108 | Shi-Yu Huang, Kwang-Ting Cheng, Kuang-Chien Chen, Chung-Yang Huang, Forrest Brewer: AQUILA: An Equivalence Checking System for Large Sequential Designs. IEEE Trans. Computers 49(5): 443-464 (2000) | |
| 107 | Yi-Min Jiang, Angela Krstic, Kwang-Ting Cheng: Estimation for maximum instantaneous current through supply lines for CMOS circuits. IEEE Trans. VLSI Syst. 8(1): 61-73 (2000) | |
| 106 | Huan-Chih Tsai, Kwang-Ting Cheng, Sudipta Bhawmik: On improving test quality of scan-based BIST. IEEE Trans. on CAD of Integrated Circuits and Systems 19(8): 928-938 (2000) | |
| 105 | Angela Krstic, Srimat T. Chakradhar, Kwang-Ting Cheng: Testable Path Delay Fault Cover for Sequential Circuits. J. Inf. Sci. Eng. 16(5): 673-686 (2000) | |
| 1999 | ||
| 104 | Huan-Chih Tsai, Kwang-Ting Cheng, Sudipta Bhawmik: Improving the Test Quality for Scan-Based BIST Using a General Test Application Scheme. DAC 1999: 748-753 | |
| 103 | Yi-Min Jiang, Kwang-Ting Cheng: Analysis of Performance Impact Caused by Power Supply Noise in Deep Submicron Devices. DAC 1999: 760-765 | |
| 102 | Yi-Min Jiang, Tak K. Young, Kwang-Ting Cheng: VIP - an input pattern generator for indentifying critical voltage drop for deep sub-micron designs. ISLPED 1999: 156-161 | |
| 101 | Yi-Min Jiang, Angela Krstic, Kwang-Ting Cheng: Delay testing considering power supply noise effects. ITC 1999: 181-190 | |
| 100 | Angela Krstic, Kwang-Ting (Tim) Cheng, Srimat T. Chakradhar: Testing High Speed VLSI Devices Using Slower Testers. VTS 1999: 16-21 | |
| 99 | Jiun-Lang Huang, Chen-Yang Pan, Kwang-Ting Cheng: Specification Back-Propagation and Its Application to DC Fault Simulation for Analog/Mixed-Signal Circuits. VTS 1999: 220-225 | |
| 98 | Zao Yang, Kwang-Ting Cheng, K. L. Tai: A New Bare Die Test Methodology. VTS 1999: 290-295 | |
| 97 | Kwang-Ting Cheng, Angela Krstic: Current Directions in Automatic Test-Pattern Generation. IEEE Computer 32(11): 58-64 (1999) | |
| 96 | Kwang-Ting Cheng, Shi-Yu Huang, Wei-Jin Dai: Fault emulation: A new methodology for fault grading. IEEE Trans. on CAD of Integrated Circuits and Systems 18(10): 1487-1495 (1999) | |
| 95 | Angela Krstic, Kwang-Ting Cheng, Srimat T. Chakradhar: Primitive delay faults: identification, testing, and design for testability. IEEE Trans. on CAD of Integrated Circuits and Systems 18(6): 669-684 (1999) | |
| 94 | Shi-Yu Huang, Kwang-Ting Cheng: ErrorTracer: design error diagnosis based on fault simulation techniques. IEEE Trans. on CAD of Integrated Circuits and Systems 18(9): 1341-1352 (1999) | |
| 93 | Shi-Yu Huang, Kuang-Chien Chen, Kwang-Ting Cheng: AutoFix: a hybrid tool for automatic logic rectification. IEEE Trans. on CAD of Integrated Circuits and Systems 18(9): 1376-1384 (1999) | |
| 1998 | ||
| 92 | Yi-Min Jiang, Shi-Yu Huang, Kwang-Ting Cheng, Deborah C. Wang, ChingYen Ho: A Hybrid Power Model for RTL Power Estimation. ASP-DAC 1998: 551-556 | |
| 91 | Shi-Yu Huang, Kwang-Ting Cheng, Kuang-Chien Chen, Juin-Yeu Joseph Lu: Fault-Simulation Based Design Error Diagnosis for Sequential Circuits. DAC 1998: 632-637 | |
| 90 | Douglas Chang, Kwang-Ting Cheng, Malgorzata Marek-Sadowska, Mike Tien-Chien Lee: Functional Scan Chain Testing. DATE 1998: 278-283 | |
| 89 | Yi-Min Jiang, Kwang-Ting Cheng: Exact and Approximate Estimation for Maximum Instantaneous Current of CMOS Circuits. DATE 1998: 698-702 | |
| 88 | Yi-Min Jiang, Kwang-Ting Cheng, An-Chang Deng: Estimation of maximum power supply noise for deep sub-micron designs. ISLPED 1998: 233-238 | |
| 87 | Chung-Yang Huang, Yucheng Wang, Kwang-Ting Cheng: LIBRA - a library-independent framework for post-layout performance optimization. ISPD 1998: 135-140 | |
| 86 | Huan-Chih Tsai, Sudipta Bhawmik, Kwang-Ting Cheng: An almost full-scan BIST solution-higher fault coverage and shorter test application time. ITC 1998: 1065-1073 | |
| 85 | Huan-Chih Tsai, Kwang-Ting Cheng, Chih-Jen Lin, Sudipta Bhawmik: Efficient test-point selection for scan-based BIST. IEEE Trans. VLSI Syst. 6(4): 667-676 (1998) | |
| 84 | David Ihsin Cheng, Kwang-Ting Cheng, Deborah C. Wang, Malgorzata Marek-Sadowska: A hybrid methodology for switching activities estimation. IEEE Trans. on CAD of Integrated Circuits and Systems 17(4): 357-366 (1998) | |
| 83 | Chih-Chang Lin, Malgorzata Marek-Sadowska, Kwang-Ting Cheng, Mike Tien-Chien Lee: Test-point insertion: scan paths through functional logic. IEEE Trans. on CAD of Integrated Circuits and Systems 17(9): 838-851 (1998) | |
| 1997 | ||
| 82 | Angela Krstic, Kwang-Ting Cheng: Vector Generation for Maximum Instantaneous Current Through Supply Lines for CMOS Circuits. DAC 1997: 383-388 | |
| 81 | Douglas Chang, Mike Tien-Chien Lee, Malgorzata Marek-Sadowska, Takashi Aikyo, Kwang-Ting Cheng: A Test Synthesis Approach to Reducing BALLAST DFT Overhead. DAC 1997: 466-471 | |
| 80 | Huan-Chih Tsai, Kwang-Ting Cheng, Chih-Jen Lin, Sudipta Bhawmik: A Hybrid Algorithm for Test Point Selection for Scan-Based BIST. DAC 1997: 478-483 | |
| 79 | Yi-Min Jiang, Angela Krstic, Kwang-Ting Cheng, Malgorzata Marek-Sadowska: Post-Layout Logic Restructuring for Performance Optimization. DAC 1997: 662-665 | |
| 78 | Kwang-Ting Cheng: National Science Foundation Workshop on Future Research Directions in Testing of Electronic Circuits and Systems: executive summary of workshop report. ITC 1997: 1157-1161 | |
| 77 | Angela Krstic, Kwang-Ting Cheng, Srimat T. Chakradhar: Design for Primitive Delay Fault Testability. ITC 1997: 436-445 | |
| 76 | Jiun-Lang Huang, Kwang-Ting Cheng: Analog Fault Diagnosis for Unpowered Circuit Boards. ITC 1997: 640-648 | |
| 75 | Chen-Yang Pan, Kwang-Ting Cheng: Fault Macromodeling for Analog/Mixed-Signal Circuits. ITC 1997: 913-922 | |
| 74 | Shi-Yu Huang, Kwang-Ting Cheng, Kuang-Chien Chen, David Ihsin Cheng: Error Tracer: A Fault-Simualtion-Based Approach to Design Error Diagnosis. ITC 1997: 974-981 | |
| 73 | Shi-Yu Huang, Kuang-Chien Chen, Kwang-Ting Cheng: Incremental logic rectification. VTS 1997: 143-149 | |
| 72 | Chen-Yang Pan, Kwang-Ting Cheng: Pseudorandom testing for mixed-signal circuits. IEEE Trans. on CAD of Integrated Circuits and Systems 16(10): 1173-1185 (1997) | |
| 71 | Shih-Chieh Chang, Kwang-Ting Cheng, Nam Sung Woo, Malgorzata Marek-Sadowska: Postlayout logic restructuring using alternative wires. IEEE Trans. on CAD of Integrated Circuits and Systems 16(6): 587-596 (1997) | |
| 70 | Angela Krstic, Kwang-Ting Cheng: Resynthesis of Combinational Circuits for Path Count Reduction and for Path Delay Fault Testability. J. Electronic Testing 11(1): 43-54 (1997) | |
| 69 | Kwang-Ting Cheng, Kewal K. Saluja, Hans-Joachim Wunderlich: Guest Editorial. J. Electronic Testing 11(1): 7-8 (1997) | |
| 1996 | ||
| 68 | Hisashi Kondo, Kwang-Ting Cheng: An Efficient Compact Test Generator for IDDQ Testing. Asian Test Symposium 1996: 177-182 | |
| 67 | Kwang-Ting Cheng: Built-In Self Test for Analog and Mixed-Signal Designs. Asian Test Symposium 1996: 197-198 | |
| 66 | Shi-Yu Huang, Kuang-Chien Chen, Kwang-Ting Cheng, Tien-Chien Lee: Compact Vector Generation for Accurate Power Simulation. DAC 1996: 161-164 | |
| 65 | Shi-Yu Huang, Kuang-Chien Chen, Kwang-Ting Cheng: Error Correction Based on Verification Techniques. DAC 1996: 258-261 | |
| 64 | Chih-Chang Lin, Malgorzata Marek-Sadowska, Kwang-Ting Cheng, Mike Tien-Chien Lee: Test Point Insertion: Scan Paths through Combinational Logic. DAC 1996: 268-273 | |
| 63 | David Ihsin Cheng, Kwang-Ting Cheng, Deborah C. Wang, Malgorzata Marek-Sadowska: A New Hybrid Methodology for Power Estimation. DAC 1996: 439-444 | |
| 62 | Shi-Yu Huang, Kwang-Ting Cheng, Kuang-Chien Chen: On Verifying the Correctness of Retimed Circuits. Great Lakes Symposium on VLSI 1996: 277- | |
| 61 | Hisashi Kondo, Kwang-Ting Cheng: Driving toward higher IDDQ test quality for sequential circuits: a generalized fault model and its ATPG. ICCAD 1996: 228-232 | |
| 60 | Shi-Yu Huang, Kwang-Ting Cheng, Kuang-Chien Chen, Mike Tien-Chien Lee: A novel methodology for transistor-level power estimation. ISLPED 1996: 67-72 | |
| 59 | Angela Krstic, Kwang-Ting Cheng, Srimat T. Chakradhar: Identification and Test Generation for Primitive Faults. ITC 1996: 423-432 | |
| 58 | Shi-Yu Huang, Kwang-Ting Cheng, Kuang-Chien Chen, Uwe Gläser: An ATPG-Based Framework for Verifying Sequential Equivalence. ITC 1996: 865-874 | |
| 57 | Chen-Yang Pan, Kwang-Ting Cheng: Implicit functional testing for analog circuits. VTS 1996: 489-494 | |
| 56 | Kwang-Ting Cheng, A. S. Krishnakumar: Automatic generation of functional vectors using the extended finite state machine model. ACM Trans. Design Autom. Electr. Syst. 1(1): 57-79 (1996) | |
| 55 | Kwang-Ting Cheng: Gate-level test generation for sequential circuits. ACM Trans. Design Autom. Electr. Syst. 1(4): 405-442 (1996) | |
| 54 | Kwang-Ting Cheng, Angela Krstic, Hsi-Chuan Chen: Generation of High Quality Tests for Robustly Untestable Path Delay Faults. IEEE Trans. Computers 45(12): 1379-1392 (1996) | |
| 53 | Shih-Chieh Chang, Malgorzata Marek-Sadowska, Kwang-Ting Cheng: Perturb and simplify: multilevel Boolean network optimizer. IEEE Trans. on CAD of Integrated Circuits and Systems 15(12): 1494-1504 (1996) | |
| 52 | Kwang-Ting Cheng, Hsi-Chuan Chen: Classification and identification of nonrobust untestable path delay faults. IEEE Trans. on CAD of Integrated Circuits and Systems 15(8): 845-853 (1996) | |
| 51 | Chen-Yang Pan, Kwang-Ting Cheng, Sandeep Gupta: Fault macromodeling and a testing strategy for opamps. J. Electronic Testing 9(3): 225-235 (1996) | |
| 1995 | ||
| 50 | Uwe Gläser, Kwang-Ting Cheng: Logic optimization by an improved sequential redundancy addition and removal techniques. ASP-DAC 1995 | |
| 49 | Uwe Sparmann, D. Luxenburger, Kwang-Ting Cheng, Sudhakar M. Reddy: Fast Identification of Robust Dependent Path Delay Faults. DAC 1995: 119-125 | |
| 48 | Chih-Chang Lin, Kuang-Chien Chen, Shih-Chieh Chang, Malgorzata Marek-Sadowska, Kwang-Ting Cheng: Logic Synthesis for Engineering Change. DAC 1995: 647-652 | |
| 47 | Shih-Chieh Chang, Malgorzata Marek-Sadowska, Kwang-Ting Cheng: An Efficient Algorithm for Local Don't Care Sets Calculation. DAC 1995: 663-667 | |
| 46 | Chen-Yang Pan, Kwang-Ting Cheng: Pseudo-random testing and signature analysis for mixed-signal circuits. ICCAD 1995: 102-107 | |
| 45 | Kwang-Ting Cheng, Shi-Yu Huang, Wei-Jin Dai: Fault emulation: a new approach to fault grading. ICCAD 1995: 681-686 | |
| 44 | Kwang-Ting Cheng, Chih-Jen Lin: Timing-Driven Test Point Insertion for Full-Scan and Partial-Scan BIST. ITC 1995: 506-514 | |
| 43 | Kwang-Ting Cheng: Partial scan designs without using a separate scan clock. VTS 1995: 277-282 | |
| 42 | Angela Krstic, Kwang-Ting Cheng: Generation of high quality tests for functional sensitizable paths. VTS 1995: 374-379 | |
| 41 | Kwang-Ting (Tim) Cheng: Single-Clock Partial Scan. IEEE Design & Test of Computers 12(2): 24-31 (1995) | |
| 40 | Jing-Yang Jou, Kwang-Ting (Tim) Cheng: Timing-Driven Partial Scan. IEEE Design & Test of Computers 12(4): 52-59 (1995) | |
| 39 | Luis Entrena-Arrontes, Kwang-Ting Cheng: Combinational and sequential logic optimization by redundancy addition and removal. IEEE Trans. on CAD of Integrated Circuits and Systems 14(7): 909-916 (1995) | |
| 1994 | ||
| 38 | Shih-Chieh Chang, Kwang-Ting Cheng, Nam Sung Woo, Malgorzata Marek-Sadowska: Layout Driven Logic Synthesis for FPGAs. DAC 1994: 308-313 | |
| 37 | Kwang-Ting Cheng, Hsi-Chuan Chen: Generation of High Quality Non-Robust Tests for Path Delay Faults. DAC 1994: 365-369 | |
| 36 | A. S. Krishnakumar, Kwang-Ting Cheng: On the Computation of the Set of Reachable States of Hybrid Models. DAC 1994: 615-621 | |
| 35 | Chen-Yang Pan, Kwang-Ting Cheng, Sandeep Gupta: A comprehensive fault macromodel for opamps. ICCAD 1994: 344-348 | |
| 1993 | ||
| 34 | Kwang-Ting Cheng, A. S. Krishnakumar: Automatic Functional Test Generation Using the Extended Finite State Machine Model. DAC 1993: 86-91 | |
| 33 | Luis Entrena, Kwang-Ting Cheng: Sequential logic optimization by redundancy addition and removal. ICCAD 1993: 310-315 | |
| 32 | Kwang-Ting Cheng, Hsi-Chuan Chen: Delay Testing for Non-Robust Untestable Circuits. ITC 1993: 954-961 | |
| 31 | Wayne Wei-Ming Dai, Kwang-Ting (Tim) Cheng: Guest Editor's Introduction. IEEE Design & Test of Computers 10(4): 7- (1993) | |
| 30 | Kwang-Ting Cheng: Redundancy removal for sequential circuits without reset states. IEEE Trans. on CAD of Integrated Circuits and Systems 12(1): 13-24 (1993) | |
| 29 | Kwang-Ting Cheng, Hi-Keung Tony Ma: On the over-specification problem in sequential ATPG algorithms. IEEE Trans. on CAD of Integrated Circuits and Systems 12(10): 1599-1604 (1993) | |
| 28 | Kwang-Ting Cheng: Transition fault testing for sequential circuits. IEEE Trans. on CAD of Integrated Circuits and Systems 12(12): 1971-1983 (1993) | |
| 27 | Irith Pomeranz, Kwang-Ting Cheng: STOIC: state assignment based on output/input functions. IEEE Trans. on CAD of Integrated Circuits and Systems 12(8): 1123-1131 (1993) | |
| 26 | Kwang-Ting Cheng, Srinivas Devadas, Kurt Keutzer: Delay-fault test generation and synthesis for testability under a standard scan design methodology. IEEE Trans. on CAD of Integrated Circuits and Systems 12(8): 1217-1231 (1993) | |
| 1992 | ||
| 25 | Kwang-Ting Cheng, Hi-Keung Tony Ma: On the Over-Specification Problem in Sequential ATPG Algorithms. DAC 1992: 16-21 | |
| 24 | Irith Pomeranz, Kwang-Ting Cheng: State Assignment Using Input/Output Functions. DAC 1992: 573-577 | |
| 23 | Kwang-Ting Cheng: Test generation for delay faults in non-scan and partial scan sequential circuits. ICCAD 1992: 554-559 | |
| 22 | Kwang-Ting Cheng: Transition Fault Simulation for Sequential Circuits. ITC 1992: 723-731 | |
| 21 | Kwang-Ting Cheng, Vishwani D. Agrawal: Initializability Consideration in Sequential Machine Synthesis. IEEE Trans. Computers 41(3): 374-379 (1992) | |
| 20 | Kwang-Ting Cheng, Jing-Yang Jou: A functional fault model for sequential machines. IEEE Trans. on CAD of Integrated Circuits and Systems 11(9): 1065-1073 (1992) | |
| 1991 | ||
| 19 | Kwang-Ting Cheng: On Removing Redundancy in Sequential Circuits. DAC 1991: 164-169 | |
| 18 | Kwang-Ting Cheng, Srinivas Devadas, Kurt Keutzer: Robust Delay-Fault Test Generation and Synthesis for Testability Under A Standard Scan Design Methodology. DAC 1991: 80-86 | |
| 17 | Kwang-Ting Cheng: An ATPG-Based Approach to Sequential Logic Optimization. ICCAD 1991: 372-375 | |
| 16 | Jing-Yang Jou, Kwang-Ting Cheng: Timing-Driven Partial Scan. ICCAD 1991: 404-407 | |
| 15 | Kwang-Ting Cheng, Srinivas Devadas, Kurt Keutzer: A Partial Enhanced-Scan Approach to Robust Delay-Fault Test Generation for Sequential Circuits. ITC 1991: 403-410 | |
| 1990 | ||
| 14 | Vishwani D. Agrawal, Kwang-Ting Cheng: Test Function Specification in Synthesis. DAC 1990: 235-240 | |
| 13 | Kwang-Ting Cheng, Vishwani D. Agrawal: An Entropy Measure for the Complexity of Multi-Output Boolean Functions. DAC 1990: 302-305 | |
| 12 | Vishwani D. Agrawal, Kwang-Ting Cheng: An architecture for synthesis of testable finite state machines. EURO-DAC 1990: 612-616 | |
| 11 | Kwang-Ting Cheng, Jing-Yang Jou: A Single-State-Transition Fault Model for Sequential Machines. ICCAD 1990: 226-229 | |
| 10 | Alexander Saldanha, Robert K. Brayton, Alberto L. Sangiovanni-Vincentelli, Kwang-Ting Cheng: Timing Optimization with Testability Considerations. ICCAD 1990: 460-463 | |
| 9 | Kwang-Ting Cheng, Jing-Yang Jou: Functional test generation for finite state machines. ITC 1990: 162-168 | |
| 8 | Kwang-Ting Cheng, Vishwani D. Agrawal, Ernest S. Kuh: A Simulation-Based Method for Generating Tests for Sequential Circuits. IEEE Trans. Computers 39(12): 1456-1463 (1990) | |
| 7 | Kwang-Ting Cheng, Vishwani D. Agrawal: A Partial Scan Method for Sequential Circuits with Feedback. IEEE Trans. Computers 39(4): 544-549 (1990) | |
| 6 | Vishwani D. Agrawal, Kwang-Ting Cheng: Finite state machine synthesis with embedded test function. J. Electronic Testing 1(3): 221-228 (1990) | |
| 1989 | ||
| 5 | Kwang-Ting Cheng, Vishwani D. Agrawal: An economical scan design for sequential logic test generation. FTCS 1989: 28-35 | |
| 4 | Prathima Agrawal, Vishwani D. Agrawal, Kwang-Ting Cheng, R. Tutundjian: Fault Simulation in a Pipelined Multiprocessor System. ITC 1989: 727-734 | |
| 3 | Vishwani D. Agrawal, Kwang-Ting Cheng, Prathima Agrawal: A directed search method for test generation using a concurrent simulator. IEEE Trans. on CAD of Integrated Circuits and Systems 8(2): 131-138 (1989) | |
| 1988 | ||
| 2 | Vishwani D. Agrawal, Kwang-Ting Cheng, Prathima Agrawal: Contest: A Concurrent Test Generator for Sequential Circuits. DAC 1988: 84-89 | |
| 1 | Kwang-Ting Cheng, Vishwani D. Agrawal, Ernest S. Kuh: A sequential circuit test generation using threshold-value simulation. FTCS 1988: 24-29 | |
Colors in the list of coauthors
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