Wan-Yun Chen

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2009

1 Su-Fen Yang, Wan-Yun Chen: Controlling over-adjusted process means and variances using VSI cause selecting control charts. Expert Syst. Appl. 36(3): 7170-7182 (2009)

	2009
1		Su-Fen Yang, Wan-Yun Chen: Controlling over-adjusted process means and variances using VSI cause selecting control charts. Expert Syst. Appl. 36(3): 7170-7182 (2009)

Coauthor Index

1 Su-Fen Yang [1]

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