 | 2010 |
|---|
| 4 |       | Young Moon Kim,
Tze Wee Chen,
Y. Kameda,
M. Mizuno,
Subhasish Mitra:
Gate-oxide early-life failure identification using delay shifts.
VTS 2010: 69-74 |
| 2009 |
|---|
| 3 | | Shuqing Cao,
Tze Wee Chen,
Stephen G. Beebe,
Robert W. Dutton:
ESD design challenges and strategies in deeply-scaled integrated circuits.
CICC 2009: 681-688 |
| 2008 |
|---|
| 2 | | Tze Wee Chen,
Kyunglok Kim,
Young Moon Kim,
Subhasish Mitra:
Gate-Oxide Early Life Failure Prediction.
VTS 2008: 111-118 |
| 2006 |
|---|
| 1 | | Tze Wee Chen,
Choshu Ito,
William Loh,
Robert W. Dutton:
Post-breakdown leakage resistance and its dependence on device area.
Microelectronics Reliability 46(9-11): 1612-1616 (2006) |
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