Tu Pei Chen

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2005

2 Shyue Seng Tan, Tu Pei Chen, Chew Hoe Ang, Lap Chan: Mechanism of nitrogen-enhanced negative bias temperature instability in pMOSFET. Microelectronics Reliability 45(1): 19-30 (2005)

1 Shyue Seng Tan, Tu Pei Chen, Lap Chan: Dynamic NBTI lifetime model for inverter-like waveform. Microelectronics Reliability 45(7-8): 1115-1118 (2005)

	2005
2		Shyue Seng Tan, Tu Pei Chen, Chew Hoe Ang, Lap Chan: Mechanism of nitrogen-enhanced negative bias temperature instability in pMOSFET. Microelectronics Reliability 45(1): 19-30 (2005)
1		Shyue Seng Tan, Tu Pei Chen, Lap Chan: Dynamic NBTI lifetime model for inverter-like waveform. Microelectronics Reliability 45(7-8): 1115-1118 (2005)

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