Tsung-Tang Chen

	2010
3		Tsung-Tang Chen, Po-Han Wu, Kung-Han Chen, Jiann-Chyi Rau, Shih-Ming Tzeng: The AB-filling methodology for power-aware at-speed scan testing. ITC 2010: 807
	2009
2		Tsung-Tang Chen, Wei-Lin Li, Po-Han Wu, Jiann-Chyi Rau: New Scheme of Reducing Shift and Capture Power Using the X-Filling Methodology. Asian Test Symposium 2009: 105-110
	2008
1		Po-Han Wu, Tsung-Tang Chen, Wei-Lin Li, Jiann-Chyi Rau: An efficient test-data compaction for low power VLSI testing. EIT 2008: 237-241

Coauthor Index

1	Kung-Han Chen	[3]
2	Wei-Lin Li	[1] [2]
3	Jiann-Chyi Rau	[1] [2] [3]
4	Shih-Ming Tzeng	[3]
5	Po-Han Wu	[1] [2] [3]

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