Taifeng Chen

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2001

1 Tianxu Zhao, Yue Hao, Peijun Ma, Taifeng Chen: Relation between Reliability and Yield of IC's Based on Discrete Defect Distribution Model. DFT 2001: 48-

	2001
1		Tianxu Zhao, Yue Hao, Peijun Ma, Taifeng Chen: Relation between Reliability and Yield of IC's Based on Discrete Defect Distribution Model. DFT 2001: 48-

Coauthor Index

1 Yue Hao [1]

2 Peijun Ma [1]

3 Tianxu Zhao [1]

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