 | 2011 |
| 9 |  | Chia-Hung Yeh,
Shih-Hung Chen,
Wen-Yu Tseng,
Wan-Jen Huang:
Dynamic Resource Allocation for Scalable H.264/AVC Video Transmission over MIMO Wireless Systems.
Signal Processing Systems 65(1): 117-128 (2011) |
| 2010 |
| 8 |  | Shih-Hung Chen,
Ming-Dou Ker:
Investigation on NMOS-based power-rail ESD clamp circuits with gate-driven mechanism in a 0.13-µm CMOS technology.
Microelectronics Reliability 50(6): 821-830 (2010) |
| 2009 |
| 7 |  | Shih-Hung Chen,
Chia-Hung Yeh,
Wan-Jen Huang:
Transmission Rate Enhancement for Scalable H.264/AVC Video over MIMO Wireless Systems.
PCM 2009: 55-64 |
| 6 |  | Shih-Hung Chen,
Ming-Dou Ker:
Area-Efficient ESD-Transient Detection Circuit With Smaller Capacitance for On-Chip Power-Rail ESD Protection in CMOS ICs.
IEEE Trans. on Circuits and Systems 56-II(5): 359-363 (2009) |
| 2008 |
| 5 |  | Simone Raoux,
Geoffrey W. Burr,
Matthew J. Breitwisch,
Charles T. Rettner,
Yi-Chou Chen,
Robert M. Shelby,
Martin Salinga,
Daniel Krebs,
Shih-Hung Chen,
Hsiang-Lan Lung,
Chung Hon Lam:
Phase-change random access memory: A scalable technology.
IBM Journal of Research and Development 52(4-5): 465-480 (2008) |
| 2007 |
| 4 |  | Shih-Hung Chen,
Ming-Dou Ker:
Active ESD protection circuit design against charged-device-model ESD event in CMOS integrated circuits.
Microelectronics Reliability 47(9-11): 1502-1505 (2007) |
| 2006 |
| 3 |  | Shih-Hung Chen,
Ming-Dou Ker:
Failure analysis and solutions to overcome latchup failure event of a power controller IC in bulk CMOS technology.
Microelectronics Reliability 46(7): 1042-1049 (2006) |
| 2005 |
| 2 |  | Shih-Hung Chen,
Ming-Dou Ker:
Investigation on seal-ring rules for IC product reliability in 0.25-mum CMOS technology.
Microelectronics Reliability 45(9-11): 1311-1316 (2005) |
| 2001 |
| 1 |  | Shin-Jye Liang,
Jiunn-Horng Lee,
Shih-Hung Chen,
Jr-Huang Shiau:
Networked Collaborative Environment for Hydro-Engineering.
International Journal of Computational Engineering Science 2(4): 557-568 (2001) |