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Shih-Hung Chen Coauthor index pubzone.org

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9Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLChia-Hung Yeh, Shih-Hung Chen, Wen-Yu Tseng, Wan-Jen Huang: Dynamic Resource Allocation for Scalable H.264/AVC Video Transmission over MIMO Wireless Systems. Signal Processing Systems 65(1): 117-128 (2011)
2010
8Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLShih-Hung Chen, Ming-Dou Ker: Investigation on NMOS-based power-rail ESD clamp circuits with gate-driven mechanism in a 0.13-µm CMOS technology. Microelectronics Reliability 50(6): 821-830 (2010)
2009
7Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLShih-Hung Chen, Chia-Hung Yeh, Wan-Jen Huang: Transmission Rate Enhancement for Scalable H.264/AVC Video over MIMO Wireless Systems. PCM 2009: 55-64
6Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLShih-Hung Chen, Ming-Dou Ker: Area-Efficient ESD-Transient Detection Circuit With Smaller Capacitance for On-Chip Power-Rail ESD Protection in CMOS ICs. IEEE Trans. on Circuits and Systems 56-II(5): 359-363 (2009)
2008
5Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLSimone Raoux, Geoffrey W. Burr, Matthew J. Breitwisch, Charles T. Rettner, Yi-Chou Chen, Robert M. Shelby, Martin Salinga, Daniel Krebs, Shih-Hung Chen, Hsiang-Lan Lung, Chung Hon Lam: Phase-change random access memory: A scalable technology. IBM Journal of Research and Development 52(4-5): 465-480 (2008)
2007
4Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLShih-Hung Chen, Ming-Dou Ker: Active ESD protection circuit design against charged-device-model ESD event in CMOS integrated circuits. Microelectronics Reliability 47(9-11): 1502-1505 (2007)
2006
3Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLShih-Hung Chen, Ming-Dou Ker: Failure analysis and solutions to overcome latchup failure event of a power controller IC in bulk CMOS technology. Microelectronics Reliability 46(7): 1042-1049 (2006)
2005
2Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLShih-Hung Chen, Ming-Dou Ker: Investigation on seal-ring rules for IC product reliability in 0.25-mum CMOS technology. Microelectronics Reliability 45(9-11): 1311-1316 (2005)
2001
1Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLShin-Jye Liang, Jiunn-Horng Lee, Shih-Hung Chen, Jr-Huang Shiau: Networked Collaborative Environment for Hydro-Engineering. International Journal of Computational Engineering Science 2(4): 557-568 (2001)

Coauthor Index

1Matthew J. Breitwisch [5]
2Geoffrey W. Burr [5]
3Yi-Chou Chen [5]
4Wan-Jen Huang [7] [9]
5Ming-Dou Ker [2] [3] [4] [6] [8]
6Daniel Krebs [5]
7Chung Hon Lam [5]
8Jiunn-Horng Lee [1]
9Shin-Jye Liang [1]
10Hsiang-Lan Lung [5]
11Simone Raoux [5]
12Charles T. Rettner [5]
13Martin Salinga [5]
14Robert M. Shelby [5]
15Jr-Huang Shiau [1]
16Wen-Yu Tseng [9]
17Chia-Hung Yeh [7] [9]

Colors in the list of coauthors

Last update Sun May 27 04:04:01 2012 CET by the DBLP TeamThis material is Open Data Data released under the ODC-BY 1.0 license — See also our legal information page