Shiang-Yu Chen

	2009
1		Jone F. Chen, Kuen-Shiuan Tian, Shiang-Yu Chen, Kuo-Ming Wu, C. M. Liu: Effect of NDD dosage on hot-carrier reliability in DMOS transistors. ISQED 2009: 226-229

Coauthor Index

1	Jone F. Chen	[1]
2	C. M. Liu	[1]
3	Kuen-Shiuan Tian	[1]
4	Kuo-Ming Wu	[1]

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