Ray Chen

	2001
1		Chao-Wen Tseng, Ray Chen, Edward J. McCluskey, Phil Nigh: MINVDD Testing for Weak CMOS ICs. VTS 2001: 339-345

Coauthor Index

1	Edward J. McCluskey	[1]
2	Phil Nigh	[1]
3	Chao-Wen Tseng	[1]

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