 | 2011 |
|---|
| 14 |       | Mingjing Chen,
Alex Orailoglu:
Diagnosing scan clock delay faults through statistical timing pruning.
DAC 2011: 423-428 |
| 13 | | Mingjing Chen,
Alex Orailoglu:
Diagnosing scan chain timing faults through statistical feature analysis of scan images.
DATE 2011: 185-190 |
| 2010 |
|---|
| 12 | | Mingjing Chen,
Alex Orailoglu:
Cost-effective IR-drop failure identification and yield recovery through a failure-adaptive test scheme.
DATE 2010: 63-68 |
| 11 | | Mingjing Chen,
Alex Orailoglu:
VDDmin test optimization for overscreening minimization through adaptive scan chain masking.
VTS 2010: 313-318 |
| 10 | | Chengmo Yang,
Mingjing Chen,
Alex Orailoglu:
Squashing code size in microcoded IPs while delivering high decompression speed.
Design Autom. for Emb. Sys. 14(3): 265-284 (2010) |
| 2009 |
|---|
| 9 | | Mingjing Chen,
Alex Orailoglu:
Deflecting crosstalk by routing reconsideration through refined signal correlation estimation.
ACM Great Lakes Symposium on VLSI 2009: 369-374 |
| 8 | | Chengmo Yang,
Mingjing Chen,
Alex Orailoglu:
Squashing microcode stores to size in embedded systems while delivering rapid microcode accesses.
CODES+ISSS 2009: 249-256 |
| 7 | | Mingjing Chen,
Alex Orailoglu:
Flip-Flop Hardening and Selection for Soft Error and Delay Fault Resilience.
DFT 2009: 49-57 |
| 6 | | Mingjing Chen,
Alex Orailoglu:
Scan power reduction in linear test data compression scheme.
ICCAD 2009: 78-82 |
| 2008 |
|---|
| 5 | | Mingjing Chen,
Alex Orailoglu:
Test cost minimization through adaptive test development.
ICCD 2008: 234-239 |
| 4 | | Dong Xiang,
Mingjing Chen,
Jia-Guang Sun:
Scan BIST with biased scan test signals.
Science in China Series F: Information Sciences 51(7): 881-895 (2008) |
| 2007 |
|---|
| 3 | | Mingjing Chen,
Alex Orailoglu:
Circuit-level mismatch modelling and yield optimization for CMOS analog circuits.
ICCD 2007: 526-532 |
| 2 | | Dong Xiang,
Mingjing Chen,
Hideo Fujiwara:
Using Weighted Scan Enable Signals to Improve Test Effectiveness of Scan-Based BIST.
IEEE Trans. Computers 56(12): 1619-1628 (2007) |
| 2006 |
|---|
| 1 | | Mingjing Chen,
Hosam Haggag,
Alex Orailoglu:
Decision Tree Based Mismatch Diagnosis in Analog Circuits.
VTS 2006: 278-285 |
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