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| 1997 | ||
|---|---|---|
| 1 | Ming-Jer Chen, Jib-Shin Ho: A three-parameters-only MOSFET subthreshold current CAD model considering back-gate bias and process variation. IEEE Trans. on CAD of Integrated Circuits and Systems 16(4): 343-352 (1997) | |
| 1 | Jib-Shin Ho | [1] |
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