 | 2011 |
|---|
| 9 |       | Liang-Chi Chen,
Peter Dahlgren,
Paul Dickinson,
Scott Davidson:
Transition test bring-up and diagnosis on UltraSPARCTM processors.
ITC 2011: 1-10 |
| 2009 |
|---|
| 8 | | Liang-Chi Chen,
Paul Dickinson,
Peter Dahlgren,
Scott Davidson,
Olivier Caty,
Kevin Wu:
Using transition test to understand timing behavior of logic circuits on UltraSPARCTM T2 family.
ITC 2009: 1-10 |
| 2008 |
|---|
| 7 | | Liang-Chi Chen,
Paul Dickinson,
Prasad Mantri,
Murali M. R. Gala,
Peter Dahlgren,
Subhra Bhattacharya,
Olivier Caty,
Kevin Woodling,
Thomas A. Ziaja,
David Curwen,
Wendy Yee,
Ellen Su,
Guixiang Gu,
Tim Nguyen:
Transition Test on UltraSPARC- T2 Microprocessor.
ITC 2008: 1-10 |
| 2002 |
|---|
| 6 | | Liang-Chi Chen,
Sandeep K. Gupta,
Melvin A. Breuer:
TA-PSV - Timing Analysis for Partially Specified Vectors.
J. Electronic Testing 18(1): 73-88 (2002) |
| 2001 |
|---|
| 5 | | Liang-Chi Chen,
Sandeep K. Gupta,
Melvin A. Breuer:
A New Gate Delay Model for Simultaneous Switching and Its Applications.
DAC 2001: 289-294 |
| 4 | | Liang-Chi Chen,
T. M. Mak,
Sandeep K. Gupta,
Melvin A. Breuer:
Crosstalk test generation on pseudo industrial circuits: a case study.
ITC 2001: 548-557 |
| 2000 |
|---|
| 3 | | Liang-Chi Chen,
Sandeep K. Gupta,
Melvin A. Breuer:
A new framework for static timing analysis, incremental timing refinement, and timing simulation.
Asian Test Symposium 2000: 102-107 |
| 1997 |
|---|
| 2 | | Liang-Chi Chen,
Sandeep K. Gupta,
Melvin A. Breuer:
High Quality Robust Tests for Path Delay Faults.
VTS 1997: 88-93 |
| 1993 |
|---|
| 1 | | Shambhu J. Upadhyaya,
Liang-Chi Chen:
On-chip test generation for combinational circuits by LFSR modification.
ICCAD 1993: 84-87 |
Data released under the ODC-BY 1.0 license — See also our legal information page