 | 2008 |
|---|
| 5 |       | Sheng-Yi Huang,
Kun-Ming Chen,
Guo-Wei Huang,
Cheng-Chou Hung,
Wen-Shiang Liao,
Chun-Yen Chang:
Electrical stress effect on RF power characteristics of SiGe hetero-junction bipolar transistors.
Microelectronics Reliability 48(2): 193-199 (2008) |
| 2005 |
|---|
| 4 | | Ming-Hsiang Cho,
Guo-Wei Huang,
Chia-Sung Chiu,
Kun-Ming Chen,
An-Sam Peng,
Yu-Min Teng:
A Cascade Open-Short-Thru (COST) De-Embedding Method for Microwave On-Wafer Characterization and Automatic Measurement.
IEICE Transactions 88-C(5): 845-850 (2005) |
| 3 | | Shih-Dao Wu,
Guo-Wei Huang,
Kun-Ming Chen,
Hua-Chou Tseng,
Tsun-Lai Hsu,
Chun-Yen Chang:
RF MOSFET Characterization by Four-Port Measurement.
IEICE Transactions 88-C(5): 851-856 (2005) |
| 2 | | Han-Yu Chen,
Kun-Ming Chen,
Guo-Wei Huang,
Chun-Yen Chang:
A Novel Approach for Parameter Determination of HBT Small-Signal Equivalent Circuit.
IEICE Transactions 88-C(6): 1133-1141 (2005) |
| 1 | | Han-Yu Chen,
Guo-Wei Huang,
Kun-Ming Chen,
Chun-Yen Chang:
Noise Parameters Computation of Microwave Devices Using Genetic Algorithms.
IEICE Transactions 88-C(7): 1382-1384 (2005) |
Data released under the ODC-BY 1.0 license — See also our legal information page