 | 2011 |
| 8 |  | S. H. Yang,
J. Y. Sheu,
M. K. Ieong,
M. H. Chiang,
T. Yamamoto,
J. J. Liaw,
S. S. Chang,
Y. M. Lin,
T. L. Hsu,
J. R. Hwang,
J. K. Ting,
C. H. Wu,
K. C. Ting,
F. C. Yang,
C. M. Liu,
I. L. Wu,
Y. M. Chen,
S. J. Chent,
K. S. Chen,
J. Y. Cheng,
M. H. Tsai,
W. Chang,
R. Chen,
C. C. Chen,
T. L. Lee,
C. K. Lin,
S. C. Yang,
Y. M. Sheu,
J. T. Tzeng,
L. C. Lu,
S. M. Jang,
C. H. Diaz,
Yuh-Jier Mii:
28nm metal-gate high-K CMOS SoC technology for high-performance mobile applications.
CICC 2011: 1-5 |
| 2010 |
| 7 |  | K. S. Chen,
C. C. Wang,
C. H. Wang,
C. F. Huang:
Application of RPN analysis to parameter optimization of passive components.
Microelectronics Reliability 2010: 2012-2019 |
| 6 |  | Chiao-Tzu Huang,
K. S. Chen,
Tsang-Chuan Chang:
An application of DMADV methodology for increasing the yield rate of surveillance cameras.
Microelectronics Reliability 50(2): 266-272 (2010) |
| 2008 |
| 5 |  | K. S. Chen,
T. W. Chen:
Application of Fuzzy Relative Quality Performance Matrix on the Improvement of Critical to Quality Problems.
FSKD (3) 2008: 356-360 |
| 2006 |
| 4 |  | Alongkorn Darawankul,
Joel T. Johnson,
K. S. Chen:
Comparison of Surface Scattering Models for Gaussian and Exponential Surfaces.
IGARSS 2006: 1036-1039 |
| 3 |  | K. S. Chen,
C. H. Wang,
H. T. Chen:
A MAIC approach to TFT-LCD panel quality improvement.
Microelectronics Reliability 46(7): 1189-1198 (2006) |
| 2004 |
| 2 |  | C. P. Chang,
T. Y. Chang,
C. T. Wang,
C. H. Kuo,
K. S. Chen:
Land-surface deformation corresponding to seasonal ground-water fluctuation, determining by SAR interferometry in the SW Taiwan.
Mathematics and Computers in Simulation 67(4-5): 351-359 (2004) |
| 2002 |
| 1 |  | M. L. Huang,
K. S. Chen,
Y. H. Hung:
Integrated process capability analysis with an application in backlight module.
Microelectronics Reliability 42(12): 2009-2014 (2002) |