 | 2011 |
| 10 |  | Chun-Kai Tseng,
Shi-Yu Huang,
Chia-Chien Weng,
Shan-Chien Fang,
Ji-Jan Chen:
Black-box leakage power modeling for cell library and SRAM compiler.
DATE 2011: 637-642 |
| 9 |  | Yu-Jen Huang,
Jin-Fu Li,
Ji-Jan Chen,
Ding-Ming Kwai,
Yung-Fa Chou,
Cheng-Wen Wu:
A built-in self-test scheme for the post-bond test of TSVs in 3D ICs.
VTS 2011: 20-25 |
| 2010 |
| 8 |  | Che-Wei Chou,
Jin-Fu Li,
Ji-Jan Chen,
Ding-Ming Kwai,
Yung-Fa Chou,
Cheng-Wen Wu:
A Test Integration Methodology for 3D Integrated Circuits.
Asian Test Symposium 2010: 377-382 |
| 7 |  | Yu Lee,
Ching-Yuan Yang,
Nai-Chen Daniel Cheng,
Ji-Jan Chen:
An embedded wide-range and high-resolution CLOCK jitter measurement circuit.
DATE 2010: 1637-1640 |
| 6 |  | Chin-Lung Su,
Chih-Wea Tsai,
Ching-Yi Chen,
Wan-Yu Lo,
Cheng-Wen Wu,
Ji-Jan Chen,
Wen Ching Wu,
Chien-Chung Hung,
Ming-Jer Kao:
Diagnosis of MRAM Write Disturbance Fault.
IEEE Trans. VLSI Syst. 18(12): 1762-1766 (2010) |
| 2008 |
| 5 |  | Pei-Wen Luo,
Jwu-E Chen,
Chin-Long Wey,
Liang-Chia Cheng,
Ji-Jan Chen,
Wen Ching Wu:
Impact of Capacitance Correlation on Yield Enhancement of Mixed-Signal/Analog Integrated Circuits.
IEEE Trans. on CAD of Integrated Circuits and Systems 27(11): 2097-2101 (2008) |
| 2007 |
| 4 |  | Chin-Lung Su,
Chih-Wea Tsai,
Cheng-Wen Wu,
Ji-Jan Chen,
Wen Ching Wu,
Chien-Chung Hung,
Ming-Jer Kao:
Diagnosis for MRAM write disturbance fault.
ITC 2007: 1-9 |
| 2006 |
| 3 |  | Shih Ping Lin,
Chung-Len Lee,
Jwu E. Chen,
Ji-Jan Chen,
Kun-Lun Luo,
Wen Ching Wu:
A Multilayer Data Copy Scheme for Low Cost Test with Controlled Scan-In Power for Multiple Scan Chain Designs.
ITC 2006: 1-8 |
| 2005 |
| 2 |  | Charles H.-P. Wen,
Li-C. Wang,
Kwang-Ting Cheng,
Wei-Ting Liu,
Ji-Jan Chen:
Simulation-based target test generation techniques for improving the robustness of a software-based-self-test methodology.
ITC 2005: 10 |
| 1 |  | Charles H.-P. Wen,
Li-C. Wang,
Kwang-Ting Cheng,
Kai Yang,
Wei-Ting Liu,
Ji-Jan Chen:
On A Software-Based Self-Test Methodology and Its Application.
VTS 2005: 107-113 |