Harry H. Chen

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1985

2 Harry H. Chen, Robert G. Mathews, John A. Newkirk: An Algorithm to Generate Tests for MOS Circuits at the Switch Level. ITC 1985: 304-312

1984

1 Harry H. Chen, Robert G. Mathews, John A. Newkirk: Test Generation for MOS Circuits. ITC 1984: 70-79

	1985
2		Harry H. Chen, Robert G. Mathews, John A. Newkirk: An Algorithm to Generate Tests for MOS Circuits at the Switch Level. ITC 1985: 304-312
	1984
1		Harry H. Chen, Robert G. Mathews, John A. Newkirk: Test Generation for MOS Circuits. ITC 1984: 70-79

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