 | 2012 |
| 5 |  | Chao-Hung Chen,
Hsien-Chin Chiu,
Chih-Wei Yang,
Jeffrey S. Fu,
Feng-Tso Chien:
Novel GaAs enhancement-mode/depletion-mode pHEMTs technology using high-k praseodymium oxide interlayer.
Microelectronics Reliability 52(1): 147-150 (2012) |
| 2011 |
| 4 |  | Hsien-Chin Chiu,
Chao-Hung Chen,
Che-Kai Lin,
Jeffrey S. Fu:
High electrical performance liquid-phase HBr oxidation gate insulator of InAlAs/InGaAs metamorphic MOS-mHEMT.
Microelectronics Reliability 51(8): 1337-1341 (2011) |
| 2010 |
| 3 |  | Hsien-Chin Chiu,
Chao-Hung Chen,
Chih-Wei Yang,
Jeffrey S. Fu,
Cheng-Shun Wang:
Electrical and reliability characteristics of GaAs MOSHEMTs utilizing high-k IIIB and IVB oxide layers.
Microelectronics Reliability 50(5): 631-634 (2010) |
| 2 |  | Hsien-Chin Chiu,
Chih-Wei Yang,
Chao-Hung Chen,
Che-Kai Lin,
Jeffrey S. Fu,
Hsing-Yuan Tu,
Shiang-Feng Tang:
High thermal stability AlGaAs/InGaAs enhancement-mode pHEMT using palladium-gate technology.
Microelectronics Reliability 50(6): 847-850 (2010) |
| 1998 |
| 1 |  | Kai-Chih Liang,
Shyan-Ming Yuan,
Hsin-Chi Liao,
Ruey-Kai Sheu,
Wen-Jin Lee,
Jian-Cheng Dai,
Chao-Hung Chen,
Chung-Heng Cheng:
When Java Applet Meets Object Database.
WebNet 1998 |