P. L. Cheang

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2008

2 A. H. You, P. L. Cheang: Effect of doping concentration on avalanche multiplication and excess noise factor in submicron APD. Microelectronics Reliability 48(4): 547-554 (2008)

2006

1 A. H. You, P. L. Cheang: Current impulse response of thin InP p⁺-i-n⁺ diodes. Microelectronics Journal 37(11): 1285-1288 (2006)

	2008
2		A. H. You, P. L. Cheang: Effect of doping concentration on avalanche multiplication and excess noise factor in submicron APD. Microelectronics Reliability 48(4): 547-554 (2008)
	2006
1		A. H. You, P. L. Cheang: Current impulse response of thin InP p⁺-i-n⁺ diodes. Microelectronics Journal 37(11): 1285-1288 (2006)

Coauthor Index

1 A. H. You [1] [2]

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