X. Chauffleur

	2007
4		P. Solomalala, J. Saiz, Michel Mermet-Guyennet, Alberto Castellazzi, Mauro Ciappa, X. Chauffleur, J. P. Fradin: Virtual reliability assessment of integrated power switches based on multi-domain simulation approach. Microelectronics Reliability 47(9-11): 1343-1348 (2007)
3		B. Khong, M. Legros, P. Tounsi, Ph. Dupuy, X. Chauffleur, C. Levade, G. Vanderschaeve, E. Scheid: Characterization and modelling of ageing failures on power MOSFET devices. Microelectronics Reliability 47(9-11): 1735-1740 (2007)
	2005
2		B. Khong, P. Tounsi, Ph. Dupuy, X. Chauffleur, M. Legros, A. Deram, C. Levade, G. Vanderschaeve, J. M. Dorkel, J. P. Fradin: Innovative Methodology for Predictive Reliability of Intelligent Power Devices Using Extreme Electro-thermal Fatigue. Microelectronics Reliability 45(9-11): 1717-1722 (2005)
	2001
1		Felix Beaudoin, X. Chauffleur, J. P. Fradin, Philippe Perdu, Romain Desplats, Dean Lewis: Modeling Thermal Laser Stimulation. Microelectronics Reliability 41(9-10): 1477-1482 (2001)

Coauthor Index

1	Felix Beaudoin	[1]
2	Alberto Castellazzi	[4]
3	Mauro Ciappa	[4]
4	A. Deram	[2]
5	Romain Desplats	[1]
6	J. M. Dorkel	[2]
7	Ph. Dupuy	[2] [3]
8	J. P. Fradin	[1] [2] [4]
9	B. Khong	[2] [3]
10	M. Legros	[2] [3]
11	C. Levade	[2] [3]
12	Dean Lewis	[1]
13	Michel Mermet-Guyennet	[4]
14	Philippe Perdu	[1]
15	J. Saiz	[4]
16	E. Scheid	[3]
17	P. Solomalala	[4]
18	P. Tounsi	[2] [3]
19	G. Vanderschaeve	[2] [3]

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