![]() | ![]() |
| 1995 | ||
|---|---|---|
| 5 | Vishwani D. Agrawal, Bernard Courtois, Fumiyasu Hirose, Sandip Kundu, Chung-Len Lee, Yinghua Min, P. Pal Chaudhuri: Panel: New Research Problems in the Emerging Test Technology. Asian Test Symposium 1995: 189- | |
| 1990 | ||
| 4 | Aloke. K. Das, Debanjan Saha, A. Roy Chowdhury, Susanta Misra, P. Pal Chaudhuri: Signature analysers based on additive cellular automata. FTCS 1990: 265-272 | |
| 1989 | ||
| 3 | Prasad R. Chalasani, Sudipta Bhawmik, Anurag Acharya, P. Pal Chaudhuri: Design of Testable VLSI Circuits with Minumum Area Overhead. IEEE Trans. Computers 38(10): 1460-1462 (1989) | |
| 1988 | ||
| 2 | Sudipta Bhawmik, P. Pal Chaudhuri: DFTEXPERT: An Expert System for Design of Testable VLSI Circuits. IEA/AIE (Vol. 1) 1988: 388-396 | |
| 1986 | ||
| 1 | J. S. R. Subrahmanyam, P. Pal Chaudhuri: A Divide and Conquer Testing Strategy for Detection of Multiple Faults by SFDTS. ITC 1986: 997-1006 | |
Colors in the list of coauthors
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