Kiran V. Chatty

	2010
8		T. Cilento, M. Schenkel, C. Yun, R. Mishra, Junjun Li, Kiran V. Chatty, Robert Gauthier: Simulation of ESD protection devices in an advanced CMOS technology using a TCAD workbench based on an ESD calibration methodology. Microelectronics Reliability 50(9-11): 1367-1372 (2010)
	2009
7		Adrien Ille, Wolfgang Stadler, Thomas Pompl, Harald Gossner, Tilo Brodbeck, Kai Esmark, Philipp Riess, David Alvarez, Kiran V. Chatty, Robert Gauthier, Alain Bravaix: Reliability aspects of gate oxide under ESD pulse stress. Microelectronics Reliability 49(12): 1407-1416 (2009)
6		David Alvarez, Kiran V. Chatty, Christian Russ, Michel J. Abou-Khalil, Junjun Li, Robert Gauthier, Kai Esmark, Ralph Halbach, Christopher Seguin: Design optimization of gate-silicided ESD NMOSFETs in a 45 nm bulk CMOS technology. Microelectronics Reliability 49(12): 1417-1423 (2009)
	2007
5		Ciaran J. Brennan, Shunhua Chang, Min Woo, Kiran V. Chatty, Robert Gauthier: Implementation of diode and bipolar triggered SCRs for CDM robust ESD protection in 90 nm CMOS ASICs. Microelectronics Reliability 47(7): 1030-1035 (2007)
4		Ciaran J. Brennan, Kiran V. Chatty, Jeff Sloan, Paul Dunn, Mujahid Muhammad, Robert Gauthier: Design automation to suppress cable discharge event (CDE) induced latchup in 90 nm CMOS ASICs. Microelectronics Reliability 47(7): 1069-1073 (2007)
	2006
3		David Alvarez, Michel J. Abou-Khalil, Christian Russ, Kiran V. Chatty, Robert Gauthier, D. Kontos, Junjun Li, Christopher Seguin, Ralph Halbach: Analysis of ESD failure mechanism in 65nm bulk CMOS ESD NMOSFETs with ESD implant. Microelectronics Reliability 46(9-11): 1597-1602 (2006)
	2003
2		Franco Stellari, Peilin Song, Moyra K. McManus, Robert Gauthier, Alan J. Weger, Kiran V. Chatty, Mujahid Muhammad, Pia Sanda: Optical and Electrical Testing of Latchup in I/O Interface Circuits. ITC 2003: 236-245
1		Franco Stellari, Peilin Song, Moyra K. McManus, Alan J. Weger, Robert Gauthier, Kiran V. Chatty, Mujahid Muhammad, Pia Sanda, Philip Wu, Steve Wilson: Latchup Analysis Using Emission Microscopy. Microelectronics Reliability 43(9-11): 1603-1608 (2003)

Coauthor Index

1	Michel J. Abou-Khalil	[3] [6]
2	David Alvarez	[3] [6] [7]
3	Alain Bravaix	[7]
4	Ciaran J. Brennan	[4] [5]
5	Tilo Brodbeck	[7]
6	Shunhua Chang	[5]
7	T. Cilento	[8]
8	Paul Dunn	[4]
9	Kai Esmark	[6] [7]
10	Robert Gauthier	[1] [2] [3] [4] [5] [6] [7] [8]
11	Harald Gossner	[7]
12	Ralph Halbach	[3] [6]
13	Adrien Ille	[7]
14	D. Kontos	[3]
15	Junjun Li	[3] [6] [8]
16	Moyra K. McManus	[1] [2]
17	R. Mishra	[8]
18	Mujahid Muhammad	[1] [2] [4]
19	Thomas Pompl	[7]
20	Philipp Riess	[7]
21	Christian Russ	[3] [6]
22	Pia Sanda	[1] [2]
23	M. Schenkel	[8]
24	Christopher Seguin	[3] [6]
25	Jeff Sloan	[4]
26	Peilin Song	[1] [2]
27	Wolfgang Stadler	[7]
28	Franco Stellari	[1] [2]
29	Alan J. Weger	[1] [2]
30	Steve Wilson	[1]
31	Min Woo	[5]
32	Philip Wu	[1]
33	C. Yun	[8]

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