 | 2008 |
|---|
| 9 |       | Stéphane Grauby,
M. Amine Salhi,
Luis David Patiño Lopez,
Wilfrid Claeys,
Benoît Charlot,
Stefan Dilhaire:
Comparison of thermoreflectance and scanning thermal microscopy for microelectronic device temperature variation imaging: Calibration and resolution issues.
Microelectronics Reliability 48(2): 204-211 (2008) |
| 2003 |
|---|
| 8 | | C. Roman,
Salvador Mir,
Benoît Charlot:
Building an analogue fault simulation tool and its application to MEMS.
Microelectronics Journal 34(10): 897-906 (2003) |
| 2002 |
|---|
| 7 | | Gabriela Nicolescu,
S. Martinez,
Lobna Kriaa,
Wassim Youssef,
Sungjoo Yoo,
Benoît Charlot,
Ahmed Amine Jerraya:
Application of Multi-Domain and Multi-Language Cosimulation to an Optical MEM Switch Design.
VLSI Design 2002: 426- |
| 2001 |
|---|
| 6 | | Benoît Charlot,
Salvador Mir,
Fabien Parrain,
Bernard Courtois:
Electrically Induced Stimuli For MEMS Self-Test.
VTS 2001: 210-217 |
| 5 | | Benoît Charlot,
Salvador Mir,
Fabien Parrain,
Bernard Courtois:
Generation of Electrically Induced Stimuli for MEMS Self-Test.
J. Electronic Testing 17(6): 459-470 (2001) |
| 2000 |
|---|
| 4 | | Salvador Mir,
Benoît Charlot,
Gabriela Nicolescu,
Philippe Coste,
Fabien Parrain,
Nacer-Eddine Zergainoh,
Bernard Courtois,
Ahmed Amine Jerraya,
Márta Rencz:
Towards design and validation of mixed-technology SOCs.
ACM Great Lakes Symposium on VLSI 2000: 29-33 |
| 3 | | Salvador Mir,
Benoît Charlot,
Bernard Courtois:
Extending Fault-Based Testing to Microelectromechanical Systems.
J. Electronic Testing 16(3): 279-288 (2000) |
| 1999 |
|---|
| 2 | | Benoît Charlot,
Salvador Mir,
Érika F. Cota,
Marcelo Lubaszewski,
Bernard Courtois:
Fault modeling of suspended thermal MEMS.
ITC 1999: 319-328 |
| 1 | | Salvador Mir,
Benoît Charlot:
On the Integration of Design and Test for Chips Embedding MEMS.
IEEE Design & Test of Computers 16(4): 28-38 (1999) |
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