 | 2004 |
|---|
| 4 |       | Samara L. Firebaugh,
Harry K. Charles Jr.,
R. L. Edwards,
A. C. Keeney,
S. F. Wilderson:
Optical deflection measurement for characterization of microelectromechanical systems (MEMS).
IEEE T. Instrumentation and Measurement 53(4): 1047-1051 (2004) |
| 2003 |
|---|
| 3 | | Harry K. Charles Jr.,
K. J. Mach,
S. J. Lehtonen,
Arthur S. Francomacaro,
J. S. DeBoy,
R. L. Edwards:
Wirebonding at higher ultrasonic frequencies: reliability and process implications.
Microelectronics Reliability 43(1): 141-153 (2003) |
| 2001 |
|---|
| 2 | | Deborah M. Mechtel,
Harry K. Charles Jr.,
Arthur S. Francomacaro:
The development of poled polyimide dielectric layers for simultaneous testing and light guiding applications in MCM-Ds.
Microelectronics Reliability 41(11): 1847-1855 (2001) |
| 1 | | Harry K. Charles Jr.:
Tradeoffs in multichip module yield and cost with known good die probability and repair.
Microelectronics Reliability 41(5): 715-733 (2001) |
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