Li-Chang Chao

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2009

2 Li-Chang Chao, Lee-Ing Tong: Wafer defect pattern recognition by multi-class support vector machines by using a novel defect cluster index. Expert Syst. Appl. 36(6): 10158-10167 (2009)

2008

1 Lee-Ing Tong, Li-Chang Chao: Novel yield model for integrated circuits with clustered defects. Expert Syst. Appl. 34(4): 2334-2341 (2008)

	2009
2		Li-Chang Chao, Lee-Ing Tong: Wafer defect pattern recognition by multi-class support vector machines by using a novel defect cluster index. Expert Syst. Appl. 36(6): 10158-10167 (2009)
	2008
1		Lee-Ing Tong, Li-Chang Chao: Novel yield model for integrated circuits with clustered defects. Expert Syst. Appl. 34(4): 2334-2341 (2008)

Coauthor Index

1 Lee-Ing Tong [1] [2]

Last update Sun May 27 04:04:01 2012 CET by the DBLP Team —

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