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| 2001 | ||
|---|---|---|
| 1 | L. Militaru, A. Souifi, M. Mouis, A. Chantre, G. Brémond: Investigation of deep traps in silicon-germanium epitaxial base bipolar transistors with a single polysilicon quasi self-aligned architecture. Microelectronics Reliability 41(2): 253-263 (2001) | |
| 1 | G. Brémond | [1] |
| 2 | L. Militaru | [1] |
| 3 | M. Mouis | [1] |
| 4 | A. Souifi (Abdelkader Souifi) | [1] |
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