Yi-Shing Chang

	2008
16		Jian Kang, Sharad C. Seth, Yi-Shing Chang, Vijay Gangaram: Efficient Selection of Observation Points for Functional Tests. ISQED 2008: 236-241
15		I-De Huang, Yi-Shing Chang, Suriyaprakash Natarajan, Ramesh Sharma, Sandeep K. Gupta: On Accelerating Path Delay Fault Simulation of Long Test Sequences. ITC 2008: 1-9
14		I-De Huang, Yi-Shing Chang, Sandeep K. Gupta, Sreejit Chakravarty: An Industrial Case Study of Sticky Path-Delay Faults. VTS 2008: 395-402
13		Abhijit Jas, Yi-Shing Chang, Sreejit Chakravarty: A Methodology for Handling Complex Functional Constraints for Large Industrial Designs. J. Electronic Testing 24(1-3): 259-269 (2008)
	2006
12		Abhijit Jas, Yi-Shing Chang, Sreejit Chakravarty: An Approach to Minimizing Functional Constraints. DFT 2006: 215-226
11		Manan Syal, Kameshwar Chandrasekar, Vishnu C. Vimjam, Michael S. Hsiao, Yi-Shing Chang, Sreejit Chakravarty: A Study of Implication Based Pseudo Functional Testing. ITC 2006: 1-10
	2005
10		Yi-Shing Chang, Sreejit Chakravarty, Hiep Hoang, Nick Thorpe, Khen Wee: Transition Tests for High Performance Microprocessors. VTS 2005: 29-34
9		Sreejit Chakravarty, Yi-Shing Chang, Hiep Hoang, Sridhar Jayaraman, Silvio Picano, Cheryl Prunty, Eric W. Savage, Rehan Sheikh, Eric N. Tran, Khen Wee: Experimental Evaluation of Bridge Patterns for a High Performance Microprocessor. VTS 2005: 337-342
8		Sandip Kundu, Sujit T. Zachariah, Yi-Shing Chang, Chandra Tirumurti: On modeling crosstalk faults. IEEE Trans. on CAD of Integrated Circuits and Systems 24(12): 1909-1915 (2005)
	2004
7		Chandra Tirumurti, Sandip Kundu, Susmita Sur-Kolay, Yi-Shing Chang: A Modeling Approach for Addressing Power Supply Switching Noise Related Failures of Integrated Circuit. DATE 2004: 1078-1083
	2003
6		Sujit T. Zachariah, Yi-Shing Chang, Sandip Kundu, Chandra Tirumurti: On Modeling Cross-Talk Faults. DATE 2003: 10490-10495
5		Yi-Shing Chang, Sandeep K. Gupta, Melvin A. Breuer: Test Generation for Maximizing Ground Bounce Considering Circuit Delay. VTS 2003: 151-157
	2001
4		Yi-Shing Chang, Sandeep K. Gupta, Melvin A. Breuer: Test Generation for Maximizing Ground Bounce for Internal Circuitry with Reconvergent Fan-out. VTS 2001: 358-367
	1999
3		Yi-Shing Chang, Sandeep K. Gupta, Melvin A. Breuer: Test Generation for Ground Bounce in Internal Logic Circuitry. VTS 1999: 95-105
	1997
2		Yi-Shing Chang, Sandeep K. Gupta, Melvin A. Breuer: Analysis of Ground Bounce in Deep Sub-Micron Circuits. VTS 1997: 110-116
	1992
1		Thou-Ho Chen, Liang-Gee Chen, Yi-Shing Chang: Design of Concurrent Error-Detectable VLSI-Based Array Dividers. ICCD 1992: 72-75

Coauthor Index

1	Melvin A. Breuer	[2] [3] [4] [5]
2	Sreejit Chakravarty	[9] [10] [11] [12] [13] [14]
3	Kameshwar Chandrasekar	[11]
4	Chao-Ho Chen (Thou-Ho Chen)	[1]
5	Liang-Gee Chen	[1]
6	Vijay Gangaram	[16]
7	Sandeep K. Gupta	[2] [3] [4] [5] [14] [15]
8	Hiep Hoang	[9] [10]
9	Michael S. Hsiao	[11]
10	I-De Huang	[14] [15]
11	Abhijit Jas	[12] [13]
12	Sridhar Jayaraman	[9]
13	Jian Kang	[16]
14	Sandip Kundu	[6] [7] [8]
15	Suriyaprakash Natarajan	[15]
16	Silvio Picano	[9]
17	Cheryl Prunty	[9]
18	Eric W. Savage	[9]
19	Sharad C. Seth	[16]
20	Ramesh Sharma	[15]
21	Rehan Sheikh	[9]
22	Susmita Sur-Kolay	[7]
23	Manan Syal	[11]
24	Nick Thorpe	[10]
25	Chandra Tirumurti	[6] [7] [8]
26	Eric N. Tran	[9]
27	Vishnu C. Vimjam	[11]
28	Khen Wee	[9] [10]
29	Sujit T. Zachariah	[6] [8]

Colors in the list of coauthors

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