Shi-Sen Chang

	2000
2		Shih-Chieh Chang, Wen-Ben Jone, Shi-Sen Chang: TAIR: testability analysis by implication reasoning. IEEE Trans. on CAD of Integrated Circuits and Systems 19(1): 152-160 (2000)
	1998
1		Shih-Chieh Chang, Shi-Sen Chang, Wen-Ben Jone, Chien-Chung Tsai: A novel combinational testability analysis by considering signal correlation. ITC 1998: 658-667

Coauthor Index

1	Shih-Chieh Chang	[1] [2]
2	Wen-Ben Jone	[1] [2]
3	Chien-Chung Tsai	[1]

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