Jonathan T.-Y. Chang

	1998
6		Jonathan T.-Y. Chang, Chao-Wen Tseng, Chien-Mo James Li, Mike Purtell, Edward J. McCluskey: Analysis of pattern-dependent and timing-dependent failures in an experimental test chip. ITC 1998: 184-193
5		Jonathan T.-Y. Chang, Edward J. McCluskey: Detecting resistive shorts for CMOS domino circuits. ITC 1998: 890-899
4		Jonathan T.-Y. Chang, Chao-Wen Tseng, Yi-Chin Chu, Sanjay Wattal, Mike Purtell, Edward J. McCluskey: Experimental Results for IDDQ and VLV Testing. VTS 1998: 118-125
	1997
3		Jonathan T.-Y. Chang, Edward J. McCluskey: SHOrt voltage elevation (SHOVE) test for weak CMOS ICs. VTS 1997: 446-
	1996
2		Jonathan T.-Y. Chang, Edward J. McCluskey: Detecting Delay Flaws by Very-Low-Voltage Testing. ITC 1996: 367-376
1		Jonathan T.-Y. Chang, Edward J. McCluskey: Quantitative analysis of very-low-voltage testing. VTS 1996: 332-337

Coauthor Index

1	Yi-Chin Chu	[4]
2	Chien-Mo James Li (James Chien-Mo Li, J. C.-M. Li)	[6]
3	Edward J. McCluskey	[1] [2] [3] [4] [5] [6]
4	Mike Purtell	[4] [6]
5	Chao-Wen Tseng	[4] [6]
6	Sanjay Wattal	[4]

Last update Sun May 27 04:04:01 2012 CET by the DBLP Team — Data released under the ODC-BY 1.0 license — See also our legal information page