Jia-Wei Chang

	2009
3		Chuan-Yu Chang, ChunHsi Li, Jia-Wei Chang, MuDer Jeng: An unsupervised neural network approach for automatic semiconductor wafer defect inspection. Expert Syst. Appl. 36(1): 950-958 (2009)
	2005
2		Chuan-Yu Chang, Jia-Wei Chang, MuDer Jeng: An Unsupervised Self-Organizing Neural Network for Automatic Semiconductor Wafer Defect Inspection. ICRA 2005: 3000-3005
	2004
1		Chuan-Yu Chang, Jia-Wei Chang, MuDer Jeng: Using a self-organizing neural network for wafer defect inspection. SMC (5) 2004: 4312-4317

Coauthor Index

1	Chuan-Yu Chang	[1] [2] [3]
2	MuDer Jeng	[1] [2] [3]
3	ChunHsi Li	[3]

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