Da-Ming Chang

	2008
3		Da-Ming Chang, Jin-Fu Li, Yu-Jen Huang: A Built-In Redundancy-Analysis Scheme for Random Access Memories with Two-Level Redundancy. J. Electronic Testing 24(1-3): 181-192 (2008)
	2006
2		Tsu-Wei Tseng, Jin-Fu Li, Da-Ming Chang: A built-in redundancy-analysis scheme for RAMs with 2D redundancy using 1D local bitmap. DATE 2006: 53-58
1		Yu-Jen Huang, Da-Ming Chang, Jin-Fu Li: A Built-In Redundancy-Analysis Scheme for Self-Repairable RAMs with Two-Level Redundancy. DFT 2006: 362-370

Coauthor Index

1	Yu-Jen Huang	[1] [3]
2	Jin-Fu Li	[1] [2] [3]
3	Tsu-Wei Tseng	[2]

Last update Tue May 29 01:28:40 2012 CET by the DBLP Team — Data released under the ODC-BY 1.0 license — See also our legal information page