 | 2011 |
|---|
| 8 |       | Maheshwar Chandrasekar,
Michael S. Hsiao:
Fault Collapsing Using a Novel Extensibility Relation.
VLSI Design 2011: 268-273 |
| 7 | | Maheshwar Chandrasekar,
Michael S. Hsiao:
A Novel Learning Framework for State Space Exploration Based on Search State Extensibility Relation.
VLSI Design 2011: 64-69 |
| 2010 |
|---|
| 6 | | Nikhil P. Rahagude,
Maheshwar Chandrasekar,
Michael S. Hsiao:
DFT + DFD: An Integrated Method for Design for Testability and Diagnosability.
Asian Test Symposium 2010: 218-223 |
| 5 | | Maheshwar Chandrasekar,
Nikhil P. Rahagude,
Michael S. Hsiao:
Search State Compatibility Based Incremental Learning Framework and Output Deviation Based X-filling for Diagnostic Test Generation.
J. Electronic Testing 26(2): 165-176 (2010) |
| 2009 |
|---|
| 4 | | Edward B. Allen,
Maheshwar Chandrasekar,
Karolina A. Sarnowska:
C preprocessor use in numerical tools: an empirical analysis.
ACM Southeast Regional Conference 2009 |
| 3 | | Maheshwar Chandrasekar,
Michael S. Hsiao:
Diagnostic Test Generation for silicon diagnosis with an incremental learning framework based on search state compatibility.
HLDVT 2009: 68-75 |
| 2 | | Swapneel Donglikar,
Mainak Banga,
Maheshwar Chandrasekar,
Michael S. Hsiao:
Fast circuit topology based method to configure the scan chains in Illinois Scan architecture.
ITC 2009: 1-10 |
| 2008 |
|---|
| 1 | | Mainak Banga,
Maheshwar Chandrasekar,
Lei Fang,
Michael S. Hsiao:
Guided test generation for isolation and detection of embedded trojans in ics.
ACM Great Lakes Symposium on VLSI 2008: 363-366 |
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