Anshuman Chandra

	2011
33		Anshuman Chandra, Jyotirmoy Saikia, Rohit Kapur: Breaking the Test Application Time Barriers in Compression: Adaptive Scan-Cyclical (AS-C). Asian Test Symposium 2011: 432-437
	2009
32		Anshuman Chandra, Rohit Kapur, Yasunari Kanzawa: Scalable Adaptive Scan (SAS). DATE 2009: 1476-1481
31		Anshuman Chandra, Yasunari Kanzawa, Rohit Kapur: Proactive management of X's in scan chains for compression. ISQED 2009: 260-265
	2008
30		Anshuman Chandra, Felix Ng, Rohit Kapur: Low Power Illinois Scan Architecture for Simultaneous Power and Test Data Volume Reduction. DATE 2008: 462-467
29		Anshuman Chandra, Rohit Kapur: Interval Based X-Masking for Scan Compression Architectures. ISQED 2008: 821-826
28		Anshuman Chandra, Rohit Kapur: Bounded Adjacent Fill for Low Capture Power Scan Testing. VTS 2008: 131-138
	2007
27		Anshuman Chandra, Haihua Yan, Rohit Kapur: Multimode Illinois Scan Architecture for Test Application Time and Test Data Volume Reduction. VTS 2007: 84-92
26		Yinhe Han, Yu Hu, Xiaowei Li, Huawei Li, Anshuman Chandra: Embedded Test Decompressor to Reduce the Required Channels and Vector Memory of Tester for Complex Processor Circuit. IEEE Trans. VLSI Syst. 15(5): 531-540 (2007)
25		Rohit Kapur, T. Finklea, Felix Ng, Anshuman Chandra, Sanjay Ramnath, Peter Wohl, Thomas W. Williams, Ashok Anbalan, Sandeep S. Kulkarni, Tammy Fernandes, Pramod Notiyath, Rajesh Uppuluri: DFT MAX and Power. J. Low Power Electronics 3(2): 199-205 (2007)
	2006
24		Yinhe Han, Xiaowei Li, Huawei Li, Anshuman Chandra: Embedded test resource for SoC to reduce required tester channels based on advanced convolutional codes. IEEE T. Instrumentation and Measurement 55(2): 389-399 (2006)
23		Yinhe Han, Huawei Li, Xiaowei Li, Anshuman Chandra: Response compaction for system-on-a-chip based on advanced convolutional codes. Science in China Series F: Information Sciences 49(2): 262-272 (2006)
	2005
22		Yinhe Han, Xiaowei Li, Shivakumar Swaminathan, Yu Hu, Anshuman Chandra: Scan Data Volume Reduction Using Periodically Alterable MUXs Decompressor. Asian Test Symposium 2005: 372-377
21		Yinhe Han, Yu Hu, Xiaowei Li, Huawei Li, Anshuman Chandra, Xiaoqing Wen: Wrapper Scan Chains Design for Rapid and Low Power Testing of Embedded Cores. IEICE Transactions 88-D(9): 2126-2134 (2005)
20		Yinhe Han, Xiaowei Li, Huawei Li, Anshuman Chandra: Test Resource Partitioning Based on Efficient Response Compaction for Test Time and Tester Channels Reduction. J. Comput. Sci. Technol. 20(2): 201-209 (2005)
	2004
19		Yinhe Han, Yu Hu, Huawei Li, Xiaowei Li, Anshuman Chandra: Rapid and Energy-Efficient Testing for Embedded Cores. Asian Test Symposium 2004: 8-13
18		Yinhe Han, Yu Hu, Huawei Li, Xiaowei Li, Anshuman Chandra: Response Compaction for Test Time and Test Pins Reduction Based on Advanced Convolutional Codes. DFT 2004: 298-305
17		Anshuman Chandra, Krishnendu Chakrabarty: Analysis of Test Application Time for Test Data Compression Methods Based on Compression Codes. J. Electronic Testing 20(2): 199-212 (2004)
	2003
16		Yinhe Han, Yongjun Xu, Huawei Li, Xiaowei Li, Anshuman Chandra: Test Resource Partitioning Based on Efficient Response Compaction for Test Time and Teste. Asian Test Symposium 2003: 440-445
15		Vikram Iyengar, Anshuman Chandra, Sharon Schweizer, Krishnendu Chakrabarty: A Unified Approach for SOC Testing Using Test Data Compression and TAM Optimization. DATE 2003: 11188-11190
14		Vikram Iyengar, Anshuman Chandra: A Uni.ed SOC Test Approach Based on Test Data Compression and TAM Design. DFT 2003: 511-518
13		Anshuman Chandra, Krishnendu Chakrabarty: Test Data Compression and Test Resource Partitioning for System-on-a-Chip Using Frequency-Directed Run-Length (FDR) Codes. IEEE Trans. Computers 52(8): 1076-1088 (2003)
12		Anshuman Chandra, Krishnendu Chakrabarty: A unified approach to reduce SOC test data volume, scan power and testing time. IEEE Trans. on CAD of Integrated Circuits and Systems 22(3): 352-363 (2003)
	2002
11		Anshuman Chandra, Krishnendu Chakrabarty: Reduction of SOC test data volume, scan power and testing time using alternating run-length codes. DAC 2002: 673-678
10		Anshuman Chandra, Krishnendu Chakrabarty: Test Resource Partitioning and Reduced Pin-Count Testing Based on Test Data Compression. DATE 2002: 598-603
9		Anshuman Chandra, Krishnendu Chakrabarty, Rafael A. Medina: How Effective are Compression Codes for Reducing Test Data Volume? VTS 2002: 91-96
8		Anshuman Chandra, Krishnendu Chakrabarty: Low-power scan testing and test data compression forsystem-on-a-chip. IEEE Trans. on CAD of Integrated Circuits and Systems 21(5): 597-604 (2002)
7		Anshuman Chandra, Krishnendu Chakrabarty: Test data compression and decompression based on internal scanchains and Golomb coding. IEEE Trans. on CAD of Integrated Circuits and Systems 21(6): 715-722 (2002)
	2001
6		Anshuman Chandra, Krishnendu Chakrabarty: Combining Low-Power Scan Testing and Test Data Compression for System-on-a-Chip. DAC 2001: 166-169
5		Anshuman Chandra, Krishnendu Chakrabarty: Efficient test data compression and decompression for system-on-a-chip using internal scan chains and Golomb coding. DATE 2001: 145-149
4		Anshuman Chandra, Krishnendu Chakrabarty: Frequency-Directed Run-Length (FDR) Codes with Application to System-on-a-Chip Test Data Compression. VTS 2001: 42-47
3		Anshuman Chandra, Krishnendu Chakrabarty: Test Resource Partitioning for SOCs. IEEE Design & Test of Computers 18(5): 80-91 (2001)
2		Anshuman Chandra, Krishnendu Chakrabarty: System-on-a-chip test-data compression and decompressionarchitectures based on Golomb codes. IEEE Trans. on CAD of Integrated Circuits and Systems 20(3): 355-368 (2001)
	2000
1		Anshuman Chandra, Krishnendu Chakrabarty: Test Data Compression for System-on-a-Chip Using Golomb Codes. VTS 2000: 113-120

Coauthor Index

1	Ashok Anbalan	[25]
2	Krishnendu Chakrabarty	[1] [2] [3] [4] [5] [6] [7] [8] [9] [10] [11] [12] [13] [15] [17]
3	Tammy Fernandes	[25]
4	T. Finklea	[25]
5	Yinhe Han	[16] [18] [19] [20] [21] [22] [23] [24] [26]
6	Yu Hu	[18] [19] [21] [22] [26]
7	Vikram Iyengar	[14] [15]
8	Yasunari Kanzawa	[31] [32]
9	Rohit Kapur	[25] [27] [28] [29] [30] [31] [32] [33]
10	Sandeep S. Kulkarni	[25]
11	Huawei Li	[16] [18] [19] [20] [21] [23] [24] [26]
12	Xiaowei Li	[16] [18] [19] [20] [21] [22] [23] [24] [26]
13	Rafael A. Medina	[9]
14	Felix Ng	[25] [30]
15	Pramod Notiyath	[25]
16	Sanjay Ramnath	[25]
17	Jyotirmoy Saikia	[33]
18	Sharon Schweizer	[15]
19	Shivakumar Swaminathan	[22]
20	Rajesh Uppuluri	[25]
21	Xiaoqing Wen	[21]
22	Thomas W. Williams	[25]
23	Peter Wohl	[25]
24	Yongjun Xu	[16]
25	Haihua Yan	[27]

Last update Tue May 29 01:28:40 2012 CET by the DBLP Team — Data released under the ODC-BY 1.0 license — See also our legal information page