D. S. H. Chan

	2003
4		J. C. H. Phang, D. S. H. Chan, V. K. S. Ong, S. Kolachina, J. M. Chin, M. Palaniappan, G. Gilfeather, Y. X. Seah: Single contact beam induced current phenomenon for microelectronic failure analysis. Microelectronics Reliability 43(9-11): 1595-1602 (2003)
	2001
3		J. M. Chin, J. C. H. Phang, D. S. H. Chan, M. Palaniappan, G. Gilfeather, C. E. Soh: Single contact optical beam induced currents. Microelectronics Reliability 41(8): 1237-1242 (2001)
	2000
2		H. M. Chen, G. S. Samudra, D. S. H. Chan, Yaacob Ibrahim: Global optimization for digital MOS circuits performance. IEEE Trans. on CAD of Integrated Circuits and Systems 19(1): 161-164 (2000)
	1999
1		G. S. Samudra, H. M. Chen, D. S. H. Chan, Yaacob Ibrahim: Yield Optimization by Design Centering and Worst-Case Distance Analysis. ICCD 1999: 289-290

Coauthor Index

1	H. M. Chen	[1] [2]
2	J. M. Chin	[3] [4]
3	G. Gilfeather	[3] [4]
4	Yaacob Ibrahim	[1] [2]
5	S. Kolachina	[4]
6	V. K. S. Ong	[4]
7	M. Palaniappan	[3] [4]
8	J. C. H. Phang	[3] [4]
9	G. S. Samudra	[1] [2]
10	Y. X. Seah	[4]
11	C. E. Soh	[3]

Colors in the list of coauthors

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