P. Chalker

	2007
2		Y. V. Gomeniuk, A. N. Nazarov, Ya. N. Vovk, V. S. Lysenko, Yi Lu, Octavian Buiu, Steve Hall, R. J. Potter, P. Chalker: Charge trapping and interface states in hydrogen annealed HfO2-Si structures. Microelectronics Reliability 47(4-5): 714-717 (2007)
1		I. P. Tyagulskyy, I. N. Osiyuk, V. S. Lysenko, A. N. Nazarov, Steve Hall, Octavian Buiu, Y. Lu, R. Potter, P. Chalker: Charge trapping characterization of MOCVD HfO2/p-Si interfaces at cryogenic temperatures. Microelectronics Reliability 47(4-5): 726-728 (2007)

Coauthor Index

1	Octavian Buiu	[1] [2]
2	Y. V. Gomeniuk	[2]
3	Steve Hall	[1] [2]
4	Y. Lu	[1]
5	Yi Lu	[2]
6	V. S. Lysenko	[1] [2]
7	A. N. Nazarov	[1] [2]
8	I. N. Osiyuk	[1]
9	R. Potter	[1]
10	R. J. Potter	[2]
11	I. P. Tyagulskyy	[1]
12	Ya. N. Vovk	[2]

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