Chris D. Chalk

	2004
3		Stephen J. Spinks, Chris D. Chalk, Ian M. Bell, Mark Zwolinski: Generation and Verification of Tests for Analog Circuits Subject to Process Parameter Deviations. J. Electronic Testing 20(1): 11-23 (2004)
	2000
2		Zheng Rong Yang, Mark Zwolinski, Chris D. Chalk, Alan Christopher Williams: Applying a robust heteroscedastic probabilistic neural network toanalog fault detection and classification. IEEE Trans. on CAD of Integrated Circuits and Systems 19(1): 142-151 (2000)
	1997
1		Stephen J. Spinks, Chris D. Chalk, Ian M. Bell, Mark Zwolinski: Generation and Verification of Tests for Analogue Circuits Subject to Process Parameter Deviations. DFT 1997: 100-109

Coauthor Index

1	Ian M. Bell	[1] [3]
2	Stephen J. Spinks	[1] [3]
3	Alan Christopher Williams	[2]
4	Zheng Rong Yang	[2]
5	Mark Zwolinski	[1] [2] [3]

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