Michael Chaine

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2005

1 Michael Chaine, James Davis, Al Kearney: TLP analysis of 0.125 mum CMOS ESD input protection circuit. Microelectronics Reliability 45(2): 223-231 (2005)

	2005
1		Michael Chaine, James Davis, Al Kearney: TLP analysis of 0.125 mum CMOS ESD input protection circuit. Microelectronics Reliability 45(2): 223-231 (2005)

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