M. Chaine

	2001
1		S. Voldman, W. Anderson, R. Ashton, M. Chaine, C. Duvvury, T. Maloney, E. Worley: A strategy for characterization and evaluation of ESD robustness of CMOS semiconductor technologies. Microelectronics Reliability 41(3): 335-348 (2001)

Coauthor Index

1	W. Anderson	[1]
2	R. Ashton	[1]
3	C. Duvvury	[1]
4	T. Maloney	[1]
5	S. Voldman	[1]
6	E. Worley	[1]

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