Ward De Ceuninck

	2007
9		R. Moonen, P. Vanmeerbeek, G. Lekens, Ward De Ceuninck, P. Moens, J. Boutsen: Lifetime modeling of intrinsic gate oxide breakdown at high temperature. Microelectronics Reliability 47(9-11): 1389-1393 (2007)
	2003
8		Stefano Aresu, Ward De Ceuninck, G. Knuyt, J. Mertens, J. Manca, Luc De Schepper, Robin Degraeve, Ben Kaczer, Marc D'Olieslaeger, Jan D'Haen: A new method for the analysis of high-resolution SILC data. Microelectronics Reliability 43(9-11): 1483-1488 (2003)
7		Philippe Soussan, G. Lekens, R. Dreesen, Ward De Ceuninck, Eric Beyne: Advantage of In-situ over Ex-situ techniques as reliability tool: Aging kinetics of Imec's MCM-D discrete passives devices. Microelectronics Reliability 43(9-11): 1785-1790 (2003)
	2002
6		L. Tielemans, R. Rongen, Ward De Ceuninck: How reliable are reliability tests? Microelectronics Reliability 42(9-11): 1339-1345 (2002)
5		R. Petersen, Ward De Ceuninck, Jan D'Haen, Marc D'Olieslaeger, Luc De Schepper, O. Vendier, H. Blanck, D. Pons: Exploring the limits of Arrhenius-based life testing with heterojunction bipolar transistor technology. Microelectronics Reliability 42(9-11): 1359-1363 (2002)
4		E. Andries, R. Dreesen, K. Croes, Ward De Ceuninck, Luc De Schepper, Guido Groeseneken, K. F. Lo, Marc D'Olieslaeger, Jan D'Haen: Statistical aspects of the degradation of LDD nMOSFETs. Microelectronics Reliability 42(9-11): 1409-1413 (2002)
3		Stefano Aresu, Ward De Ceuninck, R. Dreesen, K. Croes, E. Andries, J. Manca, Luc De Schepper, Robin Degraeve, Ben Kaczer, Marc D'Olieslaeger: High-resolution SILC measurements of thin SiO2 at ultra low voltages. Microelectronics Reliability 42(9-11): 1485-1489 (2002)
	2001
2		R. Dreesen, K. Croes, J. Manca, Ward De Ceuninck, Luc De Schepper, A. Pergoot, Guido Groeseneken: A new degradation model and lifetime extrapolation technique for lightly doped drain nMOSFETs under hot-carrier degradation. Microelectronics Reliability 41(3): 437-443 (2001)
1		K. Croes, R. Dreesen, J. Manca, Ward De Ceuninck, Luc De Schepper, L. Tielemans, P. van Der Wel: High-resolution in-situ of gold electromigration: test time reduction. Microelectronics Reliability 41(9-10): 1439-1442 (2001)

Coauthor Index

1	E. Andries	[3] [4]
2	Stefano Aresu	[3] [8]
3	Eric Beyne	[7]
4	H. Blanck	[5]
5	J. Boutsen	[9]
6	K. Croes	[1] [2] [3] [4]
7	Jan D'Haen	[4] [5] [8]
8	Marc D'Olieslaeger	[3] [4] [5] [8]
9	Robin Degraeve	[3] [8]
10	R. Dreesen	[1] [2] [3] [4] [7]
11	Guido Groeseneken	[2] [4]
12	Ben Kaczer	[3] [8]
13	G. Knuyt	[8]
14	G. Lekens	[7] [9]
15	K. F. Lo	[4]
16	J. Manca	[1] [2] [3] [8]
17	J. Mertens	[8]
18	P. Moens	[9]
19	R. Moonen	[9]
20	A. Pergoot	[2]
21	R. Petersen	[5]
22	D. Pons	[5]
23	R. Rongen	[6]
24	Luc De Schepper	[1] [2] [3] [4] [5] [8]
25	Philippe Soussan	[7]
26	L. Tielemans	[1] [6]
27	P. Vanmeerbeek	[9]
28	O. Vendier	[5]
29	P. van Der Wel	[1]

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