F. Cesaretti

	2005
1		G. Cassanelli, G. Mura, F. Cesaretti, Massimo Vanzi, Fausto Fantini: Reliability predictions in electronic industrial applications. Microelectronics Reliability 45(9-11): 1321-1326 (2005)

Coauthor Index

1	G. Cassanelli	[1]
2	Fausto Fantini	[1]
3	G. Mura (Giovanna Mura)	[1]
4	Massimo Vanzi	[1]

Last update Sun May 27 04:04:01 2012 CET by the DBLP Team — Data released under the ODC-BY 1.0 license — See also our legal information page