G. Cellere

	2010
5		M. Bagatin, Simone Gerardin, Alessandro Paccagnella, G. Cellere, F. Irom, D. N. Nguyen: Destructive events in NAND Flash memories irradiated with heavy ions. Microelectronics Reliability 50(9-11): 1832-1836 (2010)
4		Simone Gerardin, M. Bagatin, Alessandro Paccagnella, G. Cellere, A. Visconti, M. Bonanomi: Impact of total dose on heavy-ion upsets in floating gate arrays. Microelectronics Reliability 50(9-11): 1837-1841 (2010)
	2007
3		M. Bagatin, G. Cellere, Simone Gerardin, Alessandro Paccagnella, A. Visconti, S. Beltrami, M. Maccarrone: Single Event Effects in 1Gbit 90nm NAND Flash Memories under Operating Conditions. IOLTS 2007: 146-151
	2006
2		G. Cellere, Alessandro Paccagnella, A. Visconti, M. Bonanomi: Erratic Effects of Irradiation in Floating Gate Memory Cells. IOLTS 2006: 51-56
	2005
1		G. Cellere, Alessandro Paccagnella, A. Visconti, M. Bonanomi: Soft Errors induced by single heavy ions in Floating Gate memory arrays. DFT 2005: 275-284

Coauthor Index

1	M. Bagatin	[3] [4] [5]
2	S. Beltrami	[3]
3	M. Bonanomi	[1] [2] [4]
4	Simone Gerardin	[3] [4] [5]
5	F. Irom	[5]
6	M. Maccarrone	[3]
7	D. N. Nguyen	[5]
8	Alessandro Paccagnella	[1] [2] [3] [4] [5]
9	A. Visconti	[1] [2] [3] [4]

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