Philippe Cauvet

	2011
13		Vincent Kerzerho, Mariane Comte, Florence Azaïs, Philippe Cauvet, Serge Bernard, Michel Renovell: Digital Test Method for Embedded Converters with Unknown-Phase Harmonics. J. Electronic Testing 27(3): 335-350 (2011)
	2008
12		Erdem Serkan Erdogan, Sule Ozev, Philippe Cauvet: Diagnosis of assembly failures for System-in-Package RF tuners. ISCAS 2008: 2286-2289
11		Ziad Noun, Philippe Cauvet, Marie-Lise Flottes, David Andreu, Serge Bernard: Wireless Test Structure for Integrated Systems. ITC 2008: 1
10		Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Michel Renovell, Mariane Comte, Omar Chakib: ADC Production Test Technique Using Low-Resolution Arbitrary Waveform Generator. VLSI Design 2008: (2008)
9		Emmanuel Simeu, Hoang Nam Nguyen, Philippe Cauvet, Salvador Mir, Libor Rufer, Rafik Khereddine: Using Signal Envelope Detection for Online and Offline RF MEMS Switch Testing. VLSI Design 2008: (2008)
	2007
8		Philippe Cauvet, Serge Bernard, Michel Renovell: System-in-Package, a Combination of Challenges and Solutions. European Test Symposium 2007: 193-199
7		Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, Michel Renovell: "Analogue Network of Converters": A DFT Technique to Test a Complete Set of ADCs and DACs Embedded in a Complex SiP or SOC. European Test Symposium 2007: 211-216
6		Brian Moore, Chris Sellathamby, Philippe Cauvet, Hérvé Fleury, M. Paulson, Md. Mahbub Reja, Lin Fu, Brenda Bai, Edwin Walter Reid, Igor M. Filanovsky, Steven Slupsky: High throughput non-contact SiP testing. ITC 2007: 1-10
5		Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, Michel Renovell: Fully digital test solution for a set of ADCs and DACs embedded in a SIP or SOC. IET Computers & Digital Techniques 1(3): 146-153 (2007)
	2006
4		Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, Michel Renovell: "Analogue Network of Converters": A DFT Technique to Test a Complete Set of ADCs and DACs Embedded in a Complex SiP or SOC. European Test Symposium 2006: 159-164
3		Vincent Fresnaud, Lilian Bossuet, Dominique Dallet, Serge Bernard, Jean-Marie Janik, B. Agnus, Philippe Cauvet, Ph. Gandy: A Low Cost Alternative Method for Harmonics Estimation in a BIST Context. European Test Symposium 2006: 193-198
2		Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, Michel Renovell: A Novel DFT Technique for Testing Complete Sets of ADCs and DACs in Complex SiPs. IEEE Design & Test of Computers 23(3): 234-243 (2006)
1		Vincent Kerzerho, Serge Bernard, Philippe Cauvet, Jean-Marie Janik: A First Step for an INL Spectral-Based BIST: The Memory Optimization. J. Electronic Testing 22(4-6): 351-357 (2006)

Coauthor Index

1	B. Agnus	[3]
2	David Andreu	[11]
3	Florence Azaïs	[2] [4] [5] [7] [10] [13]
4	Brenda Bai	[6]
5	Serge Bernard	[1] [2] [3] [4] [5] [7] [8] [10] [11] [13]
6	Lilian Bossuet	[3]
7	Omar Chakib	[10]
8	Mariane Comte	[2] [4] [5] [7] [10] [13]
9	Dominique Dallet	[3]
10	Erdem Serkan Erdogan	[12]
11	Igor M. Filanovsky	[6]
12	Hérvé Fleury	[6]
13	Marie-Lise Flottes	[11]
14	Vincent Fresnaud	[3]
15	Lin Fu	[6]
16	Ph. Gandy	[3]
17	Jean-Marie Janik	[1] [3]
18	Vincent Kerzerho	[1] [2] [4] [5] [7] [10] [13]
19	Rafik Khereddine	[9]
20	Salvador Mir	[9]
21	Brian Moore	[6]
22	Hoang Nam Nguyen	[9]
23	Ziad Noun	[11]
24	Sule Ozev	[12]
25	M. Paulson	[6]
26	Edwin Walter Reid	[6]
27	Md. Mahbub Reja	[6]
28	Michel Renovell	[2] [4] [5] [7] [8] [10] [13]
29	Libor Rufer	[9]
30	Chris Sellathamby	[6]
31	Emmanuel Simeu	[9]
32	Steven Slupsky	[6]

Colors in the list of coauthors

Last update Sun May 27 04:04:01 2012 CET by the DBLP Team — Data released under the ODC-BY 1.0 license — See also our legal information page