Thierry Carrière

	2007
4		Claudia Rusu, Antonin Bougerol, Lorena Anghel, Cécile Weulersse, Nadine Buard, S. Benhammadi, Nicolas Renaud, Guillaume Hubert, Frederic Wrobel, Thierry Carrière, Rémi Gaillard: Multiple Event Transient Induced by Nuclear Reactions in CMOS Logic Cells. IOLTS 2007: 137-145
	2006
3		Guillaume Hubert, Antonin Bougerol, Florent Miller, Nadine Buard, Lorena Anghel, Thierry Carrière, Frederic Wrobel, Rémi Gaillard: Prediction of Transient Induced by Neutron/Proton in CMOS Combinational Logic Cells. IOLTS 2006: 63-74
	2005
2		Guillaume Hubert, Nadine Buard, Cécile Weulersse, Thierry Carrière, Marie-Catherine Palau, Jean-Marie Palau, Damien Lambert, Jacques Baggio, Frederic Wrobel, Frédéric Saigné, Rémi Gaillard: A Review of DASIE Code Family: Contribution to SEU/MBU Understanding. IOLTS 2005: 87-94
	2003
1		F. Darracq, Hervé Lapuyade, Nadine Buard, Pascal Fouillat, R. Dufayel, Thierry Carrière: Low-cost backside laser test method to pre-characterize the COTS IC's sensitivity to Single Event Effects. Microelectronics Reliability 43(9-11): 1615-1619 (2003)

Coauthor Index

1	Lorena Anghel	[3] [4]
2	Jacques Baggio	[2]
3	S. Benhammadi	[4]
4	Antonin Bougerol	[3] [4]
5	Nadine Buard	[1] [2] [3] [4]
6	F. Darracq	[1]
7	R. Dufayel	[1]
8	Pascal Fouillat	[1]
9	Rémi Gaillard	[2] [3] [4]
10	Guillaume Hubert	[2] [3] [4]
11	Damien Lambert	[2]
12	Hervé Lapuyade	[1]
13	Florent Miller	[3]
14	Jean-Marie Palau	[2]
15	Marie-Catherine Palau	[2]
16	Nicolas Renaud	[4]
17	Claudia Rusu	[4]
18	Frédéric Saigné	[2]
19	Cécile Weulersse	[2] [4]
20	Frederic Wrobel	[2] [3] [4]

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