Jean-Louis Carbonéro

	2010
11		Luca Testa, Hervé Lapuyade, Yann Deval, Jean-Louis Carbonéro, Jean-Baptiste Begueret: Fault Coverage on RF VCOs and BIST for Wafer Sort Using Peak-to-Peak Voltage Detectors. J. Electronic Testing 26(3): 355-365 (2010)
	2009
10		Luca Testa, Hervé Lapuyade, Yann Deval, Olivier Mazouffre, Jean-Louis Carbonéro, Jean-Baptiste Begueret: BIST scheme for RF VCOs allowing the self-correction of the cut. ITC 2009: 1-10
	2008
9		Yves Joannon, Vincent Beroulle, Chantal Robach, Smail Tedjini, Jean-Louis Carbonéro: Decreasing Test Qualification Time in AMS and RF Systems. IEEE Design & Test of Computers 25(1): 29-37 (2008)
8		Yves Joannon, Vincent Beroulle, Chantal Robach, Smail Tedjini, Jean-Louis Carbonéro: Choice of a High-Level Fault Model for the Optimization of Validation Test Set Reused for Manufacturing Test. VLSI Design 2008: (2008)
	2007
7		Jeanne Tongbong, Salvador Mir, Jean-Louis Carbonéro: Interactive presentation: Evaluation of test measures for LNA production testing using a multinormal statistical model. DATE 2007: 731-736
6		Luís Rolíndez, Salvador Mir, Jean-Louis Carbonéro, Dimitri Goguet, Nabil Chouba: A stereo audio Σ∑ ADC architecture with embedded SNDR self-test. ITC 2007: 1-10
5		Yves Joannon, Vincent Beroulle, Chantal Robach, Smail Tedjini, Jean-Louis Carbonéro: Qualification of behavioral level design validation for AMS & RF SoCs. VLSI-SoC 2007: 206-211
	2006
4		Yves Joannon, Vincent Beroulle, Rami Khouri, Chantal Robach, Smail Tedjini, Jean-Louis Carbonéro: Behavioral Modeling of WCDMA Transceiver with VHDL-AMS Language. DDECS 2006: 113-118
3		Luís Rolíndez, Salvador Mir, Ahcène Bounceur, Jean-Louis Carbonéro: A SNDR BIST for Sigma-Delta Analogue-to-Digital Converters. VTS 2006: 314-319
2		Luís Rolíndez, Salvador Mir, Ahcène Bounceur, Jean-Louis Carbonéro: A BIST Scheme for SNDR Testing of SigmaDelta ADCs Using Sine-Wave Fitting. J. Electronic Testing 22(4-6): 325-335 (2006)
	2005
1		Rabeb Kheriji, V. Danelon, Jean-Louis Carbonéro, Salvador Mir: Optimising Test Sets for a Low Noise Amplifier with a Defect-Oriented Approach. DATE 2005: 170-171

Coauthor Index

1	Jean-Baptiste Begueret	[10] [11]
2	Vincent Beroulle	[4] [5] [8] [9]
3	Ahcène Bounceur	[2] [3]
4	Nabil Chouba	[6]
5	V. Danelon	[1]
6	Yann Deval	[10] [11]
7	Dimitri Goguet	[6]
8	Yves Joannon	[4] [5] [8] [9]
9	Rabeb Kheriji	[1]
10	Rami Khouri	[4]
11	Hervé Lapuyade	[10] [11]
12	Olivier Mazouffre	[10]
13	Salvador Mir	[1] [2] [3] [6] [7]
14	Chantal Robach	[4] [5] [8] [9]
15	Luís Rolíndez	[2] [3] [6]
16	Smail Tedjini	[4] [5] [8] [9]
17	Luca Testa	[10] [11]
18	Jeanne Tongbong	[7]

Colors in the list of coauthors

Last update Sun May 27 04:04:01 2012 CET by the DBLP Team — Data released under the ODC-BY 1.0 license — See also our legal information page