C. Capolupo

	2005
1		G. Ghidini, C. Capolupo, G. Giusto, A. Sebastiani, B. Stragliati, M. Vitali: Tunnel oxide degradation under pulsed stress. Microelectronics Reliability 45(9-11): 1337-1342 (2005)

Coauthor Index

1	G. Ghidini	[1]
2	G. Giusto	[1]
3	A. Sebastiani	[1]
4	B. Stragliati	[1]
5	M. Vitali	[1]

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