C. Canali

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2005

1 G. Verzellesi, Gaudenzio Meneghesso, Alessandro Chini, Enrico Zanoni, C. Canali: DC-to-RF dispersion effects in GaAs- and GaN-based heterostructure FETs: performance and reliability issues. Microelectronics Reliability 45(9-11): 1585-1592 (2005)

	2005
1		G. Verzellesi, Gaudenzio Meneghesso, Alessandro Chini, Enrico Zanoni, C. Canali: DC-to-RF dispersion effects in GaAs- and GaN-based heterostructure FETs: performance and reliability issues. Microelectronics Reliability 45(9-11): 1585-1592 (2005)

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