Benjamin Van Camp

	2007
3		Olivier Marichal, Geert Wybo, Benjamin Van Camp, Pieter Vanysacker, Bart Keppens: SCR-based ESD protection in nanometer SOI technologies. Microelectronics Reliability 47(7): 1060-1068 (2007)
	2006
2		Bart Keppens, Markus P. J. Mergens, Cong Son Trinh, Christian C. Russ, Benjamin Van Camp, Koen G. Verhaege: ESD protection solutions for high voltage technologies. Microelectronics Reliability 46(5-6): 677-688 (2006)
	2005
1		Markus P. J. Mergens, Geert Wybo, Bart Keppens, Benjamin Van Camp, Frederic De Ranter, Koen G. Verhaege, John Armer, Phillip Jozwiak, Christian C. Russ: ESD protection circuit design for ultra-sensitive IO applications in advanced sub-90nm CMOS technologies. ISCAS (2) 2005: 1194-1197

Coauthor Index

1	John Armer	[1]
2	Phillip Jozwiak	[1]
3	Bart Keppens	[1] [2] [3]
4	Olivier Marichal	[3]
5	Markus P. J. Mergens	[1] [2]
6	Frederic De Ranter	[1]
7	Christian C. Russ	[1] [2]
8	Cong Son Trinh	[2]
9	Pieter Vanysacker	[3]
10	Koen G. Verhaege	[1] [2]
11	Geert Wybo	[1] [3]

Last update Sun May 27 04:04:01 2012 CET by the DBLP Team — Data released under the ODC-BY 1.0 license — See also our legal information page