L. M. Camillo

	2006
1		L. M. Camillo, João Antonio Martino, Eddy Simoen, Cor Claeys: The temperature mobility degradation influence on the zero temperature coefficient of partially and fully depleted SOI MOSFETs. Microelectronics Journal 37(9): 952-957 (2006)

Coauthor Index

1	Cor Claeys	[1]
2	João Antonio Martino	[1]
3	Eddy Simoen	[1]

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